Skip to main content
Erschienen in: Journal of Electronic Testing 5/2020

21.08.2020

A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship

verfasst von: Srdjan Djordjevic, Miroljub T. Pesic

Erschienen in: Journal of Electronic Testing | Ausgabe 5/2020

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

This paper presents a new fault verification method for diagnosis of parametric faults in linear analog circuits. Although there has been much research on fault verification methods there are still some open problems, such as low testability and extensive computational procedures in the case of multiple faults. The proposed method is based on the substitution theorem. It deals with the branch currents and voltages as opposed to the standard branch fault verification method, which only considers the branch current deviations. In this way, both the magnitude and phase angle of the faulty currents are taken into consideration, allowing us to check the physical meaning of the faulty currents. The fault detection procedure is based on the frequency domain measurements and the use of the sinusoidal excitation. The presented approach enhances the diagnosability, reduces on-line computations and decreases the number of required test nodes by one. The feasibility of the method is demonstrated through measurement experiments.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Weitere Produktempfehlungen anzeigen
Literatur
1.
Zurück zum Zitat Liu RW (2012) Testing and diagnosis of analog circuits and systems. Springer-Verlag New York Inc., USA Liu RW (2012) Testing and diagnosis of analog circuits and systems. Springer-Verlag New York Inc., USA
2.
Zurück zum Zitat Robotycki A, Zielonko R (2002) Fault diagnosis of analog piecewise linear circuits based on homotopy. IEEE Trans Instrum Meas 51(4):876–881CrossRef Robotycki A, Zielonko R (2002) Fault diagnosis of analog piecewise linear circuits based on homotopy. IEEE Trans Instrum Meas 51(4):876–881CrossRef
3.
Zurück zum Zitat Tadeusiewicz M, Halgas S (2012) Multiple soft fault diagnosis of nonlinear circuits using the continuation method. J Elect Testing: Theory Appl (JETTA) 28(4):487–493CrossRef Tadeusiewicz M, Halgas S (2012) Multiple soft fault diagnosis of nonlinear circuits using the continuation method. J Elect Testing: Theory Appl (JETTA) 28(4):487–493CrossRef
4.
Zurück zum Zitat Worsman M, Wong MWT (2000) Non-linear analog circuit fault diagnosis with large change sensitivity. Int J Circuit Theory Appl 28(3):281–303CrossRef Worsman M, Wong MWT (2000) Non-linear analog circuit fault diagnosis with large change sensitivity. Int J Circuit Theory Appl 28(3):281–303CrossRef
5.
Zurück zum Zitat Fedi G, Giomi R, Luchetta A, Manetti S, Piccirilli M (1998) On the application of symbolic techniques to the multiple fault location in low testability analog circuits. IEEE Trans Circuits Syst II: Analog Digital Signal Process 45(10):1383–1388CrossRef Fedi G, Giomi R, Luchetta A, Manetti S, Piccirilli M (1998) On the application of symbolic techniques to the multiple fault location in low testability analog circuits. IEEE Trans Circuits Syst II: Analog Digital Signal Process 45(10):1383–1388CrossRef
6.
Zurück zum Zitat Filippetti F, Artioli M (2002) Cycling verify: fault diagnosis for linear analog circuits based on symbolic calculus and interval algebra. In: Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, 1, pp 589–594 Filippetti F, Artioli M (2002) Cycling verify: fault diagnosis for linear analog circuits based on symbolic calculus and interval algebra. In: Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, 1, pp 589–594
7.
Zurück zum Zitat Tadeusiewicz M, Korzybski M (2000) A method for fault diagnosis in linear electronic circuits. Int J Circuit Theory Appl 28(3):245–262CrossRef Tadeusiewicz M, Korzybski M (2000) A method for fault diagnosis in linear electronic circuits. Int J Circuit Theory Appl 28(3):245–262CrossRef
8.
Zurück zum Zitat Tadeusiewicz M, Hałgas S (2006) An algorithm for multiple fault diagnosis in analog circuits. Int J Circuit Theory Appl 34(6):607–615CrossRef Tadeusiewicz M, Hałgas S (2006) An algorithm for multiple fault diagnosis in analog circuits. Int J Circuit Theory Appl 34(6):607–615CrossRef
9.
Zurück zum Zitat Huang Z, Lin C, Liu R (1983) Node-fault diagnosis and a Design of Testability. IEEE Trans Circuits Syst 30(5):257–265MathSciNetCrossRef Huang Z, Lin C, Liu R (1983) Node-fault diagnosis and a Design of Testability. IEEE Trans Circuits Syst 30(5):257–265MathSciNetCrossRef
10.
Zurück zum Zitat Wu Y, Tong BS (1990) The effective range of k-fault diagnosis of linear circuits. J Electron (China) 7(3):207–214CrossRef Wu Y, Tong BS (1990) The effective range of k-fault diagnosis of linear circuits. J Electron (China) 7(3):207–214CrossRef
11.
Zurück zum Zitat Sun Y (2008) Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach, chapter 1. The Institute of Engineering and Technology, London, pp 1–36 Sun Y (2008) Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach, chapter 1. The Institute of Engineering and Technology, London, pp 1–36
12.
Zurück zum Zitat Sun Y (1988) Bilinear relations for fault diagnosis of linear circuits. Proceedings of CSEE and IEE Beijing Section National Conference on CAA and CAD, Zhejiang Sun Y (1988) Bilinear relations for fault diagnosis of linear circuits. Proceedings of CSEE and IEE Beijing Section National Conference on CAA and CAD, Zhejiang
13.
Zurück zum Zitat Yang C, Tian S, Liu Z, Huang J, Chen F (2013) Fault modeling on complex plane and tolerance handling methods for analog circuits. IEEE Trans Instrum Meas 62(10):2730–2738CrossRef Yang C, Tian S, Liu Z, Huang J, Chen F (2013) Fault modeling on complex plane and tolerance handling methods for analog circuits. IEEE Trans Instrum Meas 62(10):2730–2738CrossRef
14.
Zurück zum Zitat Hong-zhi H, Shu-lin T, Hou-jun W, Cheng-lin Y (2013) Fault diagnosis of analog circuits based on Phasor circle model, vol 2. Proceedings of the IEEE 11th international conference on Electronic Measurement & Instruments, Harbin, pp 792–795 Hong-zhi H, Shu-lin T, Hou-jun W, Cheng-lin Y (2013) Fault diagnosis of analog circuits based on Phasor circle model, vol 2. Proceedings of the IEEE 11th international conference on Electronic Measurement & Instruments, Harbin, pp 792–795
15.
Zurück zum Zitat Zhihua L, Liuchang L (2016) Soft-fault diagnostic method based on locus circle of steady-state node-voltage vector. Int J Circuit Theory Appl 44(2):342–363CrossRef Zhihua L, Liuchang L (2016) Soft-fault diagnostic method based on locus circle of steady-state node-voltage vector. Int J Circuit Theory Appl 44(2):342–363CrossRef
16.
Zurück zum Zitat Biernacki R, Bandler J (1981) Multiple-fault location of analog circuits. IEEE Trans Circuits Syst 28(5):361–367CrossRef Biernacki R, Bandler J (1981) Multiple-fault location of analog circuits. IEEE Trans Circuits Syst 28(5):361–367CrossRef
17.
Zurück zum Zitat Lin C, Huang Z, Liu RW (1983) Topological conditions for single-branch-fault. IEEE Trans Circuits Syst 30(6):376–381MathSciNetCrossRef Lin C, Huang Z, Liu RW (1983) Topological conditions for single-branch-fault. IEEE Trans Circuits Syst 30(6):376–381MathSciNetCrossRef
18.
Zurück zum Zitat Starzyk J, Bandler J (1983) Multiport approach to multiple-fault location in analog circuits. IEEE Trans Circuits Syst 30(10):762–765MathSciNetCrossRef Starzyk J, Bandler J (1983) Multiport approach to multiple-fault location in analog circuits. IEEE Trans Circuits Syst 30(10):762–765MathSciNetCrossRef
19.
Zurück zum Zitat Peng M, He Y, Tan Y, Huang H, Sheng X (2003) Line fault location in a distribution network based on K-fault diagnosis method, vol 1. Proceedings of IEEE International Conference on Robotics, Intelligent Systems and Signal Processing, Hunan, pp 571–575 Peng M, He Y, Tan Y, Huang H, Sheng X (2003) Line fault location in a distribution network based on K-fault diagnosis method, vol 1. Proceedings of IEEE International Conference on Robotics, Intelligent Systems and Signal Processing, Hunan, pp 571–575
20.
Zurück zum Zitat Huang JL, Cheng KT (2000) Test point selection for analog fault diagnosis of unpowered circuit boards. IEEE Trans Circuits Syst II: Analog Digital Signal Process 47(10):977–987CrossRef Huang JL, Cheng KT (2000) Test point selection for analog fault diagnosis of unpowered circuit boards. IEEE Trans Circuits Syst II: Analog Digital Signal Process 47(10):977–987CrossRef
21.
Zurück zum Zitat Lin CS, Liu RW (1981) Fault directory approach-a case study. In: Proceedings IEEE International Symposium on Circuits and Systems, Chicago, p 239–242 Lin CS, Liu RW (1981) Fault directory approach-a case study. In: Proceedings IEEE International Symposium on Circuits and Systems, Chicago, p 239–242
22.
Zurück zum Zitat Djordjevic S (2018) Analog circuit diagnosis based on the nullor concept and multiport description of the circuit. Analog Integr Circ Sig Process 95(1):141–149CrossRef Djordjevic S (2018) Analog circuit diagnosis based on the nullor concept and multiport description of the circuit. Analog Integr Circ Sig Process 95(1):141–149CrossRef
23.
Zurück zum Zitat Bandler J, Salama A (1985) Fault diagnosis of analog circuits. Proc IEEE 73(8):1279–1325CrossRef Bandler J, Salama A (1985) Fault diagnosis of analog circuits. Proc IEEE 73(8):1279–1325CrossRef
24.
Zurück zum Zitat Jiang BL, Wey CL, Fan LJ (1988) Fault prediction for analog circuits. J Circuits Syst Signal Process 7(1):95–109MathSciNetCrossRef Jiang BL, Wey CL, Fan LJ (1988) Fault prediction for analog circuits. J Circuits Syst Signal Process 7(1):95–109MathSciNetCrossRef
25.
Zurück zum Zitat Fedi G, Manetti S, Piccirilli M, Starzyk J (1999) Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 46(7):779–787CrossRef Fedi G, Manetti S, Piccirilli M, Starzyk J (1999) Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 46(7):779–787CrossRef
Metadaten
Titel
A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship
verfasst von
Srdjan Djordjevic
Miroljub T. Pesic
Publikationsdatum
21.08.2020
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 5/2020
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-020-05901-5

Weitere Artikel der Ausgabe 5/2020

Journal of Electronic Testing 5/2020 Zur Ausgabe

Neuer Inhalt