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2015 | OriginalPaper | Buchkapitel

19. A Novel Method of On-line Measuring and Analyzing the Source Impedance

verfasst von : Wenwu Song, Kai Zhang, Wei Zhang, Mengtao Qin, Bibo Ping

Erschienen in: Proceedings of the Second International Conference on Mechatronics and Automatic Control

Verlag: Springer International Publishing

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Abstract

There are many different ways of measuring the source impedance; however, they vary in applicability and accuracy. The chapter presents a simple and cheap on-line measuring method. It not only applies in AC network but also makes a good result in DC network. The chapter takes emphasis on the common-mode source impedance measuring. Further, the compensation model is established and the calibration factor against frequency is simulated. The simulation results make clear that the measuring frequency range of the method is relatively wide and can reach a good accuracy in coupling analysis and EMI filter design.

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Literatur
1.
Zurück zum Zitat Chen Y, Qiang Shi. Non-ignorable disturbance source impedance. Saf Electromagn Compat. 2010;(1):46–57. Chen Y, Qiang Shi. Non-ignorable disturbance source impedance. Saf Electromagn Compat. 2010;(1):46–57.
2.
Zurück zum Zitat Zhang D, Chen DY. Measurement of noise source impedance of off-line converters. IEEE Trans Power Electron. 2000;15(5):820–5.CrossRef Zhang D, Chen DY. Measurement of noise source impedance of off-line converters. IEEE Trans Power Electron. 2000;15(5):820–5.CrossRef
3.
Zurück zum Zitat Zhang TZ. Resistance network model. Xi’an: Xidian University Press; 2011. p. 15–31. Zhang TZ. Resistance network model. Xi’an: Xidian University Press; 2011. p. 15–31.
4.
Zurück zum Zitat Hua R, Zhang Lei, Hui Long. Analysis of insertion loss of EMI filter. Electron Sci Technol. 2011;24(1):65–7. Hua R, Zhang Lei, Hui Long. Analysis of insertion loss of EMI filter. Electron Sci Technol. 2011;24(1):65–7.
5.
Zurück zum Zitat Liu C. Design of signal EMI filter with impedance mismatch. Electron Meas Technol. 2009;32(7):9–13. Liu C. Design of signal EMI filter with impedance mismatch. Electron Meas Technol. 2009;32(7):9–13.
6.
Zurück zum Zitat Jin M, Ma W. A new technique for modeling and analysis of mixed- mode conducted EMI noise [J]. IEEE Trans Power Electron. 2004;19(6) Jin M, Ma W. A new technique for modeling and analysis of mixed- mode conducted EMI noise [J]. IEEE Trans Power Electron. 2004;19(6)
7.
Zurück zum Zitat Ozenbaugh RL, Pullen TM. EMI filter design. Boca Raton: CRC; 2011. p. 122–210.CrossRef Ozenbaugh RL, Pullen TM. EMI filter design. Boca Raton: CRC; 2011. p. 122–210.CrossRef
8.
Zurück zum Zitat Zhiyong T, Li J. An improved switch power conducted EMI source impedance test method. Mass electron. 2010;(4):72–3, 77. Zhiyong T, Li J. An improved switch power conducted EMI source impedance test method. Mass electron. 2010;(4):72–3, 77.
9.
Zurück zum Zitat Vuttipon T. Accurate extraction of noise source impedance of an SMPS under operating conditions. IEEE Trans Power Electron. 2010;25(1):111–7.CrossRef Vuttipon T. Accurate extraction of noise source impedance of an SMPS under operating conditions. IEEE Trans Power Electron. 2010;25(1):111–7.CrossRef
10.
Zurück zum Zitat Qian W, Han J. The impact of impedance on measurement. Foreign Electron Meas Technol. 2006;25(4):67–9. Qian W, Han J. The impact of impedance on measurement. Foreign Electron Meas Technol. 2006;25(4):67–9.
11.
Zurück zum Zitat Wei Y, Yang Z, Xiao-quan L, et al. A modified EMI noise source impedance modeling by employing two resistances calibration and Levenberg-Marquardt’s method. 2010 International Conference on Microwave and Millimeter Wave Technology. IEEE, 2010. p. 2021–4. Wei Y, Yang Z, Xiao-quan L, et al. A modified EMI noise source impedance modeling by employing two resistances calibration and Levenberg-Marquardt’s method. 2010 International Conference on Microwave and Millimeter Wave Technology. IEEE, 2010. p. 2021–4.
Metadaten
Titel
A Novel Method of On-line Measuring and Analyzing the Source Impedance
verfasst von
Wenwu Song
Kai Zhang
Wei Zhang
Mengtao Qin
Bibo Ping
Copyright-Jahr
2015
DOI
https://doi.org/10.1007/978-3-319-13707-0_19

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