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Journal of Electronic Testing
Erschienen in: Journal of Electronic Testing 3/2017

15.02.2017

A Passive Authentication System Based on Optical Variable Nano/Micro-Structures

verfasst von: Jasbir N. Patel, Hao Jiang, Bozena Kaminska

Erschienen in: Journal of Electronic Testing | Ausgabe 3/2017

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Abstract

A new optical authentication and security system using optical variable nano/micro-structures (OVNs) is presented. The proposed design features a passive authentication method using a simple optical system found in common fabrication facilities. The passive authentication is obtained by insertion of an OVN image directly on a processing layer or divided between multiple layers of the fabrication process. Authentic fabrication process is validated when the proper alignment (reconstructed image, for example) at the end of the fabrication is achieved. Simple proof-of-concept devices with the OVN-based authentication system are presented along with the optical images of the resulting authentication patterns.
Vorheriger Artikel A New Test Point Selection Method for Analog Continuous Parameter Fault
Nächster Artikel New Calibration Technique of Contact-less Resonant Biosensor

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Metadaten
Titel
A Passive Authentication System Based on Optical Variable Nano/Micro-Structures
verfasst von
Jasbir N. Patel
Hao Jiang
Bozena Kaminska
Publikationsdatum
15.02.2017
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 3/2017
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-017-5645-1

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Journal of Electronic Testing 3/2017 Zur Ausgabe

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