1988 | OriginalPaper | Buchkapitel
A Split Spectrum Processing Method of Scatterer Density Estimation
verfasst von : V. L. Newhouse, GuoYao Yu, Yue Li
Erschienen in: Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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The split spectrum processing method of estimating scatterer concentration and concentration gradients using the data of a single received waveform is reported. A wide-band received spectrum is partitioned into separated frequency bands which are normalized and filtered by Gaussian windows. The estimation algorithm is based on a theory which states that the squared ratio of the sample mean of the amplitudes produced by the split narrow-band signals to its standard deviation is a measure of scatterer concentration. The theory presented is shown to be confirmed by experiment.