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Erschienen in:
2017 | OriginalPaper | Buchkapitel
A Study of the Extended Definition of Relation for Research Content Based Traceability
verfasst von : Jong-Won Ko, Jae-Young Choi, Young-Hwa Cho
Erschienen in: Advances in Computer Science and Ubiquitous Computing
Verlag: Springer Singapore
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Abstract
Trace artifacts refer to any residual data or marks of the R&D process that are made amenable to being trace. we applied this term to Research Contents for R&D project in our previous research. It is called Research Descriptor also known as RD. Furthermore, the existing researches failed to fully consider the research items existing in the form of various document files and SW configuration items, for example, the support for traceability among SW UML models and source codes, UI Form and test cases and issues on traceability with the conducted R&D process to make such outcomes. In this paper, we proposed extended definitions of various perspective relationship which to support traceability for research documents, processes and source codes during the whole period of the R&D project. Also, we considered definition of logical relationship between research contents and discussed how to manage the R&D project by tracking the RD relation type.