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Erschienen in:
2003 | OriginalPaper | Buchkapitel
Analog Measurement Basics
verfasst von : Kenneth P. Parker
Erschienen in: The Boundary — Scan Handbook
Verlag: Springer US
Enthalten in: Professional Book Archive
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The preceding chapters of this book have confined the discussion to digital circuits and test subjects. Most electronic engineers are experts in digital technology but many will admit that their familiarity falls off quickly when the discussion turns to analog topics, particularly analog testing. Before getting into IEEE 1149.4 Analog Boundary-Scan, it will be important to lay a foundation for basic analog measurements used today in In-Circuit testers. While 1149.4 does have significant differences over classical In-Circuit test, there are a lot of similarities. Knowing where we came from will also help motivate where we are now going.