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Erschienen in:
Introduction Kapitel lesen Erstes Kapitel lesen

2015 | OriginalPaper | Buchkapitel

6. Analyzing Timing Variations

verfasst von : Mehdi Dehbashi, Görschwin Fey

Erschienen in: Debug Automation from Pre-Silicon to Post-Silicon

Verlag: Springer International Publishing

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Abstract

Variability is recognized to be a major challenge in analyzing the circuits as IC technology continues to scale down. In this case, delay deviations are imposed by process variations such as uncertainty in the parameters of fabricated devices and interconnects, and by environmental variations such as temperature and voltage [BCSS08, APP10, SGT+08].

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Vorheriges Kapitel Automated Debugging for Synchronization Bugs
Nächstes Kapitel Automated Debugging for Timing Variations
Fußnoten
1
At the end of Sect. 6.2.3, we discuss how more complex timing models can be handled by our approach.
 
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Metadaten
Titel
Analyzing Timing Variations
verfasst von
Mehdi Dehbashi
Görschwin Fey
Copyright-Jahr
2015
Buch
Debug Automation from Pre-Silicon to Post-Silicon

Print ISBN: 978-3-319-09308-6

Electronic ISBN: 978-3-319-09309-3

Copyright-Jahr: 2015

DOI
https://doi.org/10.1007/978-3-319-09309-3_6

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