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Erschienen in:
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2018 | Supplement | Buchkapitel

12. Antenna Measurements at Millimeter and Submillimeter Wavelengths

verfasst von : Antti V. Räisänen, Juha Ala-Laurinaho, Thomas Crowe, Sergiy Pivnenko, Manuel Sierra Castañer, Ville Viikari

Erschienen in: Aperture Antennas for Millimeter and Sub-Millimeter Wave Applications

Verlag: Springer International Publishing

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Abstract

Testing of electrically large, high-gain antennas as well as that of small integrated antennas at millimeter and submillimeter wavelengths is extremely challenging. Basically, there are three methods for measuring radiation properties of an antenna: the far-field method, the near-field method, and the compact antenna test range (CATR). In case of large antennas, the classical far-field method has two major obstacles at mm and submm wavelengths: impractically large measurement distance and high atmospheric loss. The planar near-field scanning method has been used up to 1 THz. However, the applied near-field methods often give useful information only on the main beam and its vicinity, because the field-sampling is typically very sparse. Reflector-based and hologram-based compact antenna test range (CATR) measurements have been demonstrated up to 500 GHz and 650 GHz, respectively. In the case of small integrated antennas, various techniques for on-wafer measurements have been developed. This chapter discusses the theory, techniques and limitations of the various test methods—the far-field method, planar near-field scanning and CATR as well as on-wafer measurements. Also, antenna pattern correction techniques are discussed.

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Vorheriges Kapitel Transformation Optics Applied to Antennas and Focusing Systems
Nächstes Kapitel Holographic Imaging Approach
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Metadaten
Titel
Antenna Measurements at Millimeter and Submillimeter Wavelengths
verfasst von
Antti V. Räisänen
Juha Ala-Laurinaho
Thomas Crowe
Sergiy Pivnenko
Manuel Sierra Castañer
Ville Viikari
Copyright-Jahr
2018
Buch
Aperture Antennas for Millimeter and Sub-Millimeter Wave Applications

Print ISBN: 978-3-319-62772-4

Electronic ISBN: 978-3-319-62773-1

Copyright-Jahr: 2018

DOI
https://doi.org/10.1007/978-3-319-62773-1_12

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