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Erschienen in:
1984 | OriginalPaper | Buchkapitel
Application of X-Ray Diffraction Techniques to Study the Sintering of Catalysts
verfasst von : Robert J. De Angelis, Ashok G. Dhere, James D. Lewis, Hai-Ku Kuo
Erschienen in: Materials Science Research
Verlag: Springer US
Enthalten in: Professional Book Archive
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An x-ray diffraction single profile analysis method is presented which allows the calculation of the particle size distribution function (PSD). This method is verified by using it to analyze simulated diffraction profiles from single, duplex, triplex, and normal distributions of particle sizes. This method is employed to study the sintering of a nickel catalyst.A method is developed to unfold x-ray diffraction patterns of metal to obtain the pattern from particles residing on a crystalline support. This method is employed to produce the x-ray pattern of cobalt containing particles in a 9.5% Co-ZSM-5 catalyst. The resulting pattern indicates the metallic cobalt particles contain a high density of basal plane faults.