Zeitschriftenarchiv > Journal of Electronic Testing
2022 (Band 38 | 6 Ausgaben)
2021 (Band 37 | 5 Ausgaben)
2020 (Band 36 | 6 Ausgaben)
2019 (Band 35 | 6 Ausgaben)
2018 (Band 34 | 6 Ausgaben)
2017 (Band 33 | 6 Ausgaben)
2016 (Band 32 | 6 Ausgaben)
2015 (Band 31 | 5 Ausgaben)
2014 (Band 30 | 6 Ausgaben)
2013 (Band 29 | 6 Ausgaben)
2012 (Band 28 | 6 Ausgaben)
2011 (Band 27 | 6 Ausgaben)
2010 (Band 26 | 6 Ausgaben)
2009 (Band 25 | 4 Ausgaben)
2008 (Band 24 | 4 Ausgaben)
2007 (Band 23 | 5 Ausgaben)
2006 (Band 22 | 4 Ausgaben)
2005 (Band 21 | 6 Ausgaben)
2004 (Band 20 | 6 Ausgaben)
2003 (Band 19 | 6 Ausgaben)
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Special Issue on International Conference on VLSI Design and Embedded Systems
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Special Issue on Verification and Testing Challenges in Future Microprocessor and SoC Designs
Apr 13
Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)
Feb 13
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Special Issue on High-Level Design Validation and Test; Guest Editor: Prabhat Mishra
Feb 10
Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi
Dez 09
Aug 09
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Feb 09
Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim
Dez 08
Okt 08
Aug 08
Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
Jun 08
Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi
Okt 07
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Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Jun 03
Apr 03
Feb 03