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Zeitschriftenarchiv  >  Journal of Electronic Testing

2022 (Band 38 | 6 Ausgaben)
2021 (Band 37 | 5 Ausgaben)
2020 (Band 36 | 6 Ausgaben)
2019 (Band 35 | 6 Ausgaben)
Journal of Electronic Testing 5/2019
Okt 19
Special Issue on International Conference on VLSI Design and Embedded Systems
2018 (Band 34 | 6 Ausgaben)
Journal of Electronic Testing 3/2018
Jun 18
Special Issue on Analog, Mixed-Signal and RF Testing
2017 (Band 33 | 6 Ausgaben)
Journal of Electronic Testing 3/2017
Jun 17
Special Issue on Analog, Mixed-Signal and RF Testing
2016 (Band 32 | 6 Ausgaben)
Journal of Electronic Testing 4/2016
Aug 16
Special Issue on Analog, Mixed-Signal and RF Testing
2015 (Band 31 | 5 Ausgaben)
2014 (Band 30 | 6 Ausgaben)
2013 (Band 29 | 6 Ausgaben)
Journal of Electronic Testing 5/2013
Okt 13
Special Issue on Verification and Testing Challenges in Future Microprocessor and SoC Designs
Journal of Electronic Testing 4/2013
Aug 13
Special Issue on Defect and Fault Tolerance
Journal of Electronic Testing 3/2013
Jun 13
Special Issue on Defect and Fault Tolerance
Journal of Electronic Testing 2/2013
Apr 13
Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)
2012 (Band 28 | 6 Ausgaben)
Journal of Electronic Testing 5/2012
Okt 12
Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
Journal of Electronic Testing 1/2012
Feb 12
Special Issue on Testing of Three-Dimensional Stacked Integrated Circuits
2011 (Band 27 | 6 Ausgaben)
2010 (Band 26 | 6 Ausgaben)
Journal of Electronic Testing 2/2010
Apr 10
Special Issue on High-Level Design Validation and Test; Guest Editor: Prabhat Mishra
Journal of Electronic Testing 1/2010
Feb 10
Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi
2009 (Band 25 | 4 Ausgaben)
Journal of Electronic Testing 1/2009
Feb 09
Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim
2008 (Band 24 | 4 Ausgaben)
Journal of Electronic Testing 4/2008
Aug 08
Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
Journal of Electronic Testing 1-3/2008
Jun 08
Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi
2007 (Band 23 | 5 Ausgaben)
Journal of Electronic Testing 6/2007
Dez 07
SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING
2006 (Band 22 | 4 Ausgaben)
2005 (Band 21 | 6 Ausgaben)
Journal of Electronic Testing 4/2005
Aug 05
Special Issue on On-Line-Testing and Fault Tolerance
2004 (Band 20 | 6 Ausgaben)
Journal of Electronic Testing 5/2004
Okt 04
On-line Testing
Journal of Electronic Testing 4/2004
Aug 04
Special Issue on the Third IEEE Latin-American Test Workshop
2003 (Band 19 | 6 Ausgaben)
Journal of Electronic Testing 5/2003
Okt 03
Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Journal of Electronic Testing 4/2003
Aug 03
Special Issue on the Seventh IEEE European Test Workshop