Imaging surfaces with reflected electrons from a field emissionscanning tunnelling microscope: image contrast mechanisms

F Festy; K Svensson; P Laitenberger; R E Palmer

doi:10.1088/0022-3727/34/12/313

Journal of Physics D: Applied Physics

Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms

F Festy¹, K Svensson¹, P Laitenberger¹ and R E Palmer¹

Published under licence by IOP Publishing Ltd
Journal of Physics D: Applied Physics, Volume 34, Number 12 Citation F Festy et al 2001 J. Phys. D: Appl. Phys. 34 1849 DOI 10.1088/0022-3727/34/12/313

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¹ Nanoscale Physics Research Laboratory, School of Physics and Astronomy, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, UK

Dates

Received 2 November 2000

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Abstract

Electrons backscattered from a scanning tunnelling microscope operating in the field emission mode have been collected to produce images of a rough Si(111) surface. We have obtained a spatial resolution of about 40 nm in such images. Comparison between backscattered electron images and topographic images reveals that edge enhancement and shadowing are important contrast mechanisms.

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