Investigation of InGaAs-InP quantum wells by optical spectroscopy

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Published under licence by IOP Publishing Ltd
, , Citation M S Skolnick et al 1986 Semicond. Sci. Technol. 1 29 DOI 10.1088/0268-1242/1/1/003

0268-1242/1/1/29

Abstract

A detailed study of the optical properties of InGaAs-InP single quantum wells (QWS) grown by atmospheric-pressure metal-organic chemical vapour deposition is described. Photoluminescence (PL), photoluminescence excitation (PLE), photoconductivity (PC) and electroreflectance (ER) are employed to study both undoped and modulation-doped quantum wells. The role of extrinsic processes in determining the low-temperature PL spectra is demonstrated from the variation of peak position and linewidth with temperature. The best PL linewidth obtained for a 150 AA well is 5.3 meV, fairly close to the limit imposed by alloy fluctuations in the InGaAs. The role of free carriers in the undoped QWS in determining the energy threshold for optical absorption is demonstrated from a comparison of PLE and PC spectra. Lineshape fitting of the PL spectra is described, and it is deduced that at 160K recombination processes in both doped and undoped QWS proceed with wavevector conservation, although at lower temperatures highly anomalous lineshapes are found in modulation-doped samples. The observation of a threshold in PC spectra under forward bias is interpreted as a transition from the valence-band well to the top of the conduction well. The ratio of the conduction- to valence-band discontinuities is deduced to be approximately 0.4:0.6.

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