Yield of Ion-Induced Secondary Electrons from Single Crystal

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Copyright (c) 1991 The Japan Society of Applied Physics
, , Citation Masataka Hasegawa et al 1991 Jpn. J. Appl. Phys. 30 2074 DOI 10.1143/JJAP.30.2074

1347-4065/30/9R/2074

Abstract

Anomalies in the yield of ion-induced secondary electrons from single-crystalline target are studied. They are (1) disappearance ofchannelling dips in the angular distribution of the yield of secondary electrons in MeV light ion channelling, and (2) an increase of the yield at angle of incidence on a surface smaller than about 10°. These are interpreted in terms of ion trajectories affected by crystal periodicity and effective mean escape length for secondary electrons in a solid.

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10.1143/JJAP.30.2074