Microwave Dielectric Properties of ATe3O8 (A = Sn, Zr) Ceramics

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Published 17 October 2008 Copyright (c) 2008 The Japan Society of Applied Physics
, , Citation Ganesanpotti Subodh and Mailadil Thomas Sebastian 2008 Jpn. J. Appl. Phys. 47 7943 DOI 10.1143/JJAP.47.7943

1347-4065/47/10R/7943

Abstract

ATe3O8 (A = Sn, Zr) ceramics were investigated as a promising dielectric materials for low temperature cofired ceramics (LTCC) applications. The ATe3O8 ceramics were synthesized using solid state reaction method by sintering in the temperature range 600 to 800 °C. The structure and microstructure of the ceramics were investigated using X-ray diffraction (XRD) and scanning electron microscopy (SEM) methods. The dielectric properties of the ceramics were studied in the frequency range 4–6 GHz. The SnTe3O8 ceramic has a dielectric constant (εr) of 37.3, quality factor (Qu×f) of 9600 GHz, and temperature coefficient of resonant frequency (τf) of 223 ppm/°C, respectively. Ceramics with the composition 0.9TeO2–0.1SnTe3O8 has εr of 26.7, Qu×f of 10000 GHz, and a τf of 32 ppm/°C when sintered at 650 °C/2 h. ZrTe3O8 has relatively high εr of 67.5, Qu×f of 1800 GHz, and high positive τf of 362 ppm/°C.

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10.1143/JJAP.47.7943