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Machine Vision and Applications

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01.08.2014 | Original Paper

Automatic optical phase identification of micro-drill bits based on improved ASM and bag of shape segment in PCB production

verfasst von: Guifang Duan, Hongcui Wang, Zhenyu Liu, Jianrong Tan, Yen-Wei Chen

Erschienen in: Machine Vision and Applications | Ausgabe 6/2014

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Abstract

This paper addresses the problem of automatic optical phase identification of micro-drill bits for micro-drilling tool inspection in printed circuit board production. To overcome the limitations of conventional active shape model (ASM) on shape modeling of micro-drill bits, six key landmarks are defined for the initialization and optimization of ASM, and a novel method based on projection profiles is also proposed for these key landmarks detection. In addition, to involve the local shape feature, a bag of shape segment (BoSS) model is developed. Based on the improved ASM and BoSS, a new shape representation of micro-drill bits is proposed for phase identification. Experimental results show that the proposed method outperforms the conventional ASM and can improve the phase identification accuracy of micro-drill bits.

Vorheriger Artikel Multilayer background modeling under occlusions

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Titel: Automatic optical phase identification of micro-drill bits based on improved ASM and bag of shape segment in PCB production
verfasst von: Guifang Duan
Hongcui Wang
Zhenyu Liu
Jianrong Tan
Yen-Wei Chen
Publikationsdatum: 01.08.2014
Verlag: Springer Berlin Heidelberg
Erschienen in: Machine Vision and Applications / Ausgabe 6/2014
Print ISSN: 0932-8092
Elektronische ISSN: 1432-1769
DOI: https://doi.org/10.1007/s00138-014-0627-0

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