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Erschienen in: Journal of Electronic Testing 6/2018

30.10.2018

Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT

verfasst von: Xu Bai, Hui Hu, Wanjun Li, Fulu Liu

Erschienen in: Journal of Electronic Testing | Ausgabe 6/2018

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Abstract

Time-interleaved analog-to-digital(TIADC) is an effective way to improve the sampling rate of an analog-to-digital converter(ADC) system. However, the unavoidable timing mismatch, gain mismatch and offset mismatch significantly degrade the performance of TIADC. In this paper, a blind calibration algorithm based on Fast Fourier Transform Algorithm(FFT) is proposed for the gain, offset and timing mismatches in a two-channel TIADC system. The explicit amplitude relationships between the input signal and the spurs caused by mismatches are derived in the frequency domain. With the explicit amplitude relationships, the frequency component of the input signal, which has the maximal energy, is used to estimate the gain and timing mismatches. The amplitude spectrum of the spur caused by offset mismatch is used to estimate the offset mismatch. The proposed algorithm needs no extra circuits and no training signal and can dynamically track the changes of the mismatches. Simulations show that the estimation errors are no more than 4%. Finally, a two-channel TIADC prototype is used to verify and demonstrate the proposed algorithm.

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Literatur
1.
Zurück zum Zitat Black WC Jr, Hodgges D (1980) Time interleaved converter arrays. IEEE J Solid State Circuits 15:1022–1029CrossRef Black WC Jr, Hodgges D (1980) Time interleaved converter arrays. IEEE J Solid State Circuits 15:1022–1029CrossRef
2.
Zurück zum Zitat Dias Pereira JM, Silva Girão PMN, Cruz Serra AM (2004) An FFT based method to evaluate and compensate gain and offset errors of interleaved ADC system. IEEE Trans Instrum Meas 53:423–430CrossRef Dias Pereira JM, Silva Girão PMN, Cruz Serra AM (2004) An FFT based method to evaluate and compensate gain and offset errors of interleaved ADC system. IEEE Trans Instrum Meas 53:423–430CrossRef
3.
Zurück zum Zitat Dyer KC, Fu D, Lewis SH, Hurst PJ (1998) An analog background calibration technique for time-interleaved analog-to-digital converters. IEEE J Solid State Circuits 33: 1912–1919, 1998CrossRef Dyer KC, Fu D, Lewis SH, Hurst PJ (1998) An analog background calibration technique for time-interleaved analog-to-digital converters. IEEE J Solid State Circuits 33: 1912–1919, 1998CrossRef
4.
Zurück zum Zitat . Farrow CW (1988) A coutinuously variable digital delay element. In International Symposium on Circuits and Systems (1988), pp 2641–2645 . Farrow CW (1988) A coutinuously variable digital delay element. In International Symposium on Circuits and Systems (1988), pp 2641–2645
5.
Zurück zum Zitat Guo LP, Tian SL, Wang ZG (2014) Estimation and correction of gain mismatch and timing error in time-interleaved ADCs based on DFT. Metrol Meas Syst 21:535–544CrossRef Guo LP, Tian SL, Wang ZG (2014) Estimation and correction of gain mismatch and timing error in time-interleaved ADCs based on DFT. Metrol Meas Syst 21:535–544CrossRef
6.
Zurück zum Zitat Guo LP, Tian SL, Jiang J (2015) Estimation of channel mismatches in time-interleaved analog-to-digital converters based on fractional delay and since curve fitting. Rev Sci Instrum 86:1–6 Guo LP, Tian SL, Jiang J (2015) Estimation of channel mismatches in time-interleaved analog-to-digital converters based on fractional delay and since curve fitting. Rev Sci Instrum 86:1–6
7.
Zurück zum Zitat Huang S, Levy BC (2006) Adaptive blind calibration of timing offset and gain mismatch for two-channel time-interleaved ADCs. IEEE Trans Circuits Syst I: Regular Papers 53:1278–1288CrossRef Huang S, Levy BC (2006) Adaptive blind calibration of timing offset and gain mismatch for two-channel time-interleaved ADCs. IEEE Trans Circuits Syst I: Regular Papers 53:1278–1288CrossRef
8.
Zurück zum Zitat Jenq YC (1988) Digital spectra of nonuniformly sampled signals: fundamentals and high-speed waveform digitizers. IEEE Trans Instrum Meas 37:245–251CrossRef Jenq YC (1988) Digital spectra of nonuniformly sampled signals: fundamentals and high-speed waveform digitizers. IEEE Trans Instrum Meas 37:245–251CrossRef
9.
Zurück zum Zitat Laakso TI, Valimaki V, Karjalainen M, Laine UK (1996) Splitting the unit delay-tools for fraction delay filter design. IEEE Signal Processing Mag 13:30–60CrossRef Laakso TI, Valimaki V, Karjalainen M, Laine UK (1996) Splitting the unit delay-tools for fraction delay filter design. IEEE Signal Processing Mag 13:30–60CrossRef
10.
Zurück zum Zitat Liu SJ, Qi PP, Wang JS, Zhang MH, Jiang WS (2014) Adaptive calibration of channel mismatches in time-interleaved ADCs based on equivalent signal recombination. IEEE Trans Instrum Meas 63:277–286CrossRef Liu SJ, Qi PP, Wang JS, Zhang MH, Jiang WS (2014) Adaptive calibration of channel mismatches in time-interleaved ADCs based on equivalent signal recombination. IEEE Trans Instrum Meas 63:277–286CrossRef
11.
Zurück zum Zitat . Liu SJ, Xu XJ, Zou YX (2015) Blind timing skew estimation based on spectra sparsity and all phase FFT for time-interleaved ADCs. In DSP. IEEE International Conference 2015, pp 926–930 . Liu SJ, Xu XJ, Zou YX (2015) Blind timing skew estimation based on spectra sparsity and all phase FFT for time-interleaved ADCs. In DSP. IEEE International Conference 2015, pp 926–930
12.
Zurück zum Zitat Nakamura K, Hotta M, Carley LR, Allsot DJ (1995) An 85mw,10b,40Msamples/s coms parellel pipelined adc. IEEE J Solid State Circuits 30:173–182CrossRef Nakamura K, Hotta M, Carley LR, Allsot DJ (1995) An 85mw,10b,40Msamples/s coms parellel pipelined adc. IEEE J Solid State Circuits 30:173–182CrossRef
13.
Zurück zum Zitat Naoki K, Haruo K, Haoru M et al (2001) Explicit analysis of channel mismatch effects in time-interleaved ADC systems. IEEE trans. Circuits Syst 1: Fundam. Theory Appl 48:261–271 Naoki K, Haruo K, Haoru M et al (2001) Explicit analysis of channel mismatch effects in time-interleaved ADC systems. IEEE trans. Circuits Syst 1: Fundam. Theory Appl 48:261–271
14.
Zurück zum Zitat Pan HQ, Tian SL, Ye P (2010) An adaptive synthesis calibration method for time-interleaved sampling systems. Metrol Meas Syst 17:405–414CrossRef Pan HQ, Tian SL, Ye P (2010) An adaptive synthesis calibration method for time-interleaved sampling systems. Metrol Meas Syst 17:405–414CrossRef
15.
Zurück zum Zitat Qin GJ, Liu GM, Gao MG, Fu XJ, Xu P (2014) Correction of sample-time error for time-interleaved sampling system using cubic spline interpolation. Metrol Meas Syst 21:485–496CrossRef Qin GJ, Liu GM, Gao MG, Fu XJ, Xu P (2014) Correction of sample-time error for time-interleaved sampling system using cubic spline interpolation. Metrol Meas Syst 21:485–496CrossRef
16.
Zurück zum Zitat Saleem S, Vogel C (2011) Adaptive blind background calibration of polynomial-represented frequency response mismatches in a two-channel time-interleaved ADC. IEEE Trans Circuits Syst I:Regular Papers 58:1300–1310MathSciNetCrossRef Saleem S, Vogel C (2011) Adaptive blind background calibration of polynomial-represented frequency response mismatches in a two-channel time-interleaved ADC. IEEE Trans Circuits Syst I:Regular Papers 58:1300–1310MathSciNetCrossRef
17.
Zurück zum Zitat Singh S, Vallant G, Epp M, Schlecker W(2013) A novel blind adaptive correction algorithm for 2-channel time-interleaved ADCs. In 19th IMEKO TC 4 Symp./17th IWADC adc. In Instrum Sensors Interoperability workshop 2013, pp 188–193 Singh S, Vallant G, Epp M, Schlecker W(2013) A novel blind adaptive correction algorithm for 2-channel time-interleaved ADCs. In 19th IMEKO TC 4 Symp./17th IWADC adc. In Instrum Sensors Interoperability workshop 2013, pp 188–193
18.
Zurück zum Zitat Singh S, Anttila L, Epp M, Schlecker W, Valkama M (2015) Analysis, blind identification, and correction of frequency response mismatch in Two-Channel time interleaved ADCs. IEEE Trans Microw Theory Tech 63:1721–1734CrossRef Singh S, Anttila L, Epp M, Schlecker W, Valkama M (2015) Analysis, blind identification, and correction of frequency response mismatch in Two-Channel time interleaved ADCs. IEEE Trans Microw Theory Tech 63:1721–1734CrossRef
19.
Zurück zum Zitat .Vogel C, Johansson H (2006) Time-interleaved analog-to-digital converters: status and future directions. In IEEE international symposium on circuits and systems conference, 2006. ISCAS, pp 3386–3389 .Vogel C, Johansson H (2006) Time-interleaved analog-to-digital converters: status and future directions. In IEEE international symposium on circuits and systems conference, 2006. ISCAS, pp 3386–3389
20.
Zurück zum Zitat Wang ZG, Guo LP, Tian SL, Liu T (2014) Estimation and correction of mismatch errors in time-interleaved ADCs. J Electron Test 30:629–635CrossRef Wang ZG, Guo LP, Tian SL, Liu T (2014) Estimation and correction of mismatch errors in time-interleaved ADCs. J Electron Test 30:629–635CrossRef
21.
Zurück zum Zitat Wang L, Guo LP, Jiang J, Qiu DY (2015) A Hilbert-transform-based method to estimate and correct timing error in time-interleaved ADCs. J Electron Test 31:291–299CrossRef Wang L, Guo LP, Jiang J, Qiu DY (2015) A Hilbert-transform-based method to estimate and correct timing error in time-interleaved ADCs. J Electron Test 31:291–299CrossRef
22.
Zurück zum Zitat Wang YN, Johansson H, Xu H, Sun ZL (2015) Joint blind calibration for mixed mismatches in two-channel time-interleaved ADCs. IEEE Trans Circuits Syst I:Regular Papers 62:1508–1517MathSciNetCrossRef Wang YN, Johansson H, Xu H, Sun ZL (2015) Joint blind calibration for mixed mismatches in two-channel time-interleaved ADCs. IEEE Trans Circuits Syst I:Regular Papers 62:1508–1517MathSciNetCrossRef
23.
Zurück zum Zitat Yang KJ, Tian SL, Ye P, Zhang P, Zheng YJ (2015, 2015) A statistic-based calibration method for TIADC system. Math Probl Eng:1–9MathSciNetMATH Yang KJ, Tian SL, Ye P, Zhang P, Zheng YJ (2015, 2015) A statistic-based calibration method for TIADC system. Math Probl Eng:1–9MathSciNetMATH
24.
Zurück zum Zitat Zou YX, Xu XJ (2012) Blind timing skew estimation using source spectrum sparsity in time-interleaved ADCs. IEEE Instrum Meas 61:2401–2412CrossRef Zou YX, Xu XJ (2012) Blind timing skew estimation using source spectrum sparsity in time-interleaved ADCs. IEEE Instrum Meas 61:2401–2412CrossRef
Metadaten
Titel
Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT
verfasst von
Xu Bai
Hui Hu
Wanjun Li
Fulu Liu
Publikationsdatum
30.10.2018
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 6/2018
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-018-5758-1

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