Abstract
Several important application sectors increasingly require the design of fault-tolerant circuits; reducing the cost and design time asks for a new generation of CAD tools, able to efficiently validate the adopted fault-tolerant mechanisms. This paper outlines a fault-injection platform supporting the injection of transient faults in VHDL descriptions. New techniques are proposed to speed-up fault-injection campaigns without any loss in terms of gathered information. Experimental results are provided, showing that the proposed techniques are able to reduce the total time required by fault-injection campaigns by at least one order of magnitude.
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© 2003 Kluwer Academic Publishers
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Corno, F., Entrena, L., Lopez, C., Reorda, M.S., Squillero, G. (2003). New Acceleration Techniques for Simulation-Based Fault-Injection. In: Benso, A., Prinetto, P. (eds) Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation. Frontiers in Electronic Testing, vol 23. Springer, Boston, MA. https://doi.org/10.1007/0-306-48711-X_13
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DOI: https://doi.org/10.1007/0-306-48711-X_13
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4020-7589-6
Online ISBN: 978-0-306-48711-8
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