Abstract
Optical metrology techniques are fundamental tools in optical engineering. They use the wavelength of light as the basic scale for most measurements and thus their accuracy is much higher than that of mechanical metrology methods. A good understanding of the nature of light and of optical phenomena is necessary when working with optical metrology methods. Here a review of the main metrological instruments and their associated optical phenomena will be made.
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References
D. Malacara, Z. Malacara: Handbook of Lens Design, Dekker, New York (1994)
K. Creath: Interferometric Investigation of a Laser Diode, Appl. Opt. 24, 1291–1293 (1985)
Y. Ning, K. T. V. Grattan, B. T. Meggitt, A. W. Palmer: Characteristics of Laser Diodes for Interferometric Use, Appl. Opt. 28, 3657–3661 (1989)
D. Malacara (Ed.): Optical Shop Testing, 2nd edn., Wiley, New York (1992)
J. B. HoustonJr., C. J. Buccini, P. K. O’Neill: A Laser Unequal Path Interferometer for the Optical Shop, Appl. Opt. 6, 1237–1242 (1967)
R. Kingslake: The Interferometer Patterns due to the Primary Aberrations, Trans. Opt. Soc. 27, 94, 1925-1926
J. B. Saunders: Measurement of Wavefronts without a Reference Standard: The Wavefront Shearing Interferometer, J. Res. Natl. Bur. Stand. 65, 239 (1961)
M. V. R. K. Murty: The Use of a Single Plane Parallel Plate as a Lateral Shearing Interferometer with a Visible Gas Laser Source, Appl. Opt. 3, 531–532 (1964)
A. Cornejo: Ronchi Test, in D. Malacara (Ed.): Optical Shop Testing, 2nd edn., Wiley, New York (1992)
W. H. F. Talbot: Facts Relating to Optical Science, Philos. Mag. 9, 401 (1836)
Lord Rayleigh: Philos. Mag. 11, 196 (1881)
J. Stricker: Electronic Heterodyne Readout of Fringes in Moiré Deflectometry, Opt. Lett. 10, 247–249 (1985)
I. Glatt, O. Kafri: Moiré Deflectometry-Ray Tracing Interferometry, Opt. Lasers Eng. 8, 277–320 (1988)
K. Patorski: Moiré Methods in Interferometry, Opt. Lasers Eng. 8, 147–170 (1988)
M. Takeda, S. Kobayashi: Lateral Aberration Measurements with a Digital Talbot Interferometer, Appl. Opt. 23, 1760–1764 (1984)
L. M. Foucault: Description des Procédés Employés pou Reconnaitre la Configuration des Surfaces Optiques, C. R. Acad. Sci. Paris 47, 958 (1858)
Y. I. Ostrovsky, M. M. Butusov, G. V. Ostrovskaya: Interferometry by Holography, Springer, Berlin, Heidelberg 1980
J. C. Wyant: Testing Aspherics Using Two Wavelength Holography, Appl. Opt. 10, 2113–2118 (1971)
D. Gabor: A New Microscopic Principle, Nature 161, 777 (1948)
E. N. Leith, J. Upatnieks: Reconstructed Wavefronts and Communication Theory, J. Opt. Soc. Am. 52, 1123–1130 (1962)
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Malacara-Hernández, D. (2000). Optics for Engineers. In: Rastogi, P.K. (eds) Photomechanics. Topics in Applied Physics, vol 77. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48800-6_1
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DOI: https://doi.org/10.1007/3-540-48800-6_1
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