Abstract
In recent years a great deal of effort has been devoted to the study of the growth of thin-films with microstructures that lead to physically interesting and technologically useful properties.1 Modern deposition systems increasingly have been used to produce magnetic films with controlled values of magnetization (Ms), coercivity (Hc), uniaxial anisotropy (Ku), ordering or compensation temperature (Tc), etc. Much of the driving force for this research has come from the hope that, with enough understanding and control of the microstructure and its relationship to properties, it will become easy to design magneto-optic or perpendicular recording datastorage media, or to create thin-film hard or semihard magnets which can be coupled with semiconducting integrated circuits, micromachines, microsensors, actuators, etc.
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References
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© 1991 Springer Science+Business Media New York
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Sellmyer, D.J., Shan, Z.S. (1991). Magnetism of Nanostructured Rare-Earth Multilayers. In: Hadjipanayis, G.C., Prinz, G.A. (eds) Science and Technology of Nanostructured Magnetic Materials. NATO ASI Series, vol 259. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-2590-9_19
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