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Erschienen in:
X-Ray Free Electron Lasers and Their Applications Kapitel lesen Erstes Kapitel lesen

2018 | OriginalPaper | Buchkapitel

7. Climbing the Data Mountain: Processing of SFX Data

verfasst von : Chun Hong Yoon, Thomas A. White

Erschienen in: X-ray Free Electron Lasers

Verlag: Springer International Publishing

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Abstract

Serial femtosecond crystallography experiments produce mountains of data that require FEL facilities to provide many petabytes of storage space and large compute clusters for timely processing of user data. The route to reach the summit of the data mountain requires peak finding, indexing, integration, refinement, and phasing. Those who reach the summit get a crystal clear view of the “radiation damage-free” structure of a protein that is most consistent with the observed measurements. Data processing plays a critical role in the ability to measure accurate structure factor intensities from individual diffraction snapshots and combine them in three-dimensional space. Current developments in SFX aim to take into account the huge complexity of SFX experiments, modeling variations in the beam and crystals, uncertainties in geometry, partiality, mosaicity, and figures of merit that are unique to SFX.

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Vorheriges Kapitel When Diffraction Stops and Destruction Begins
Nächstes Kapitel Phasing Serial Crystallography Data
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Metadaten
Titel
Climbing the Data Mountain: Processing of SFX Data
verfasst von
Chun Hong Yoon
Thomas A. White
Copyright-Jahr
2018
Buch
X-ray Free Electron Lasers

Print ISBN: 978-3-030-00550-4

Electronic ISBN: 978-3-030-00551-1

Copyright-Jahr: 2018

DOI
https://doi.org/10.1007/978-3-030-00551-1_7

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