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2011 | OriginalPaper | Buchkapitel

Computer Programs

verfasst von : R.F. Egerton

Erschienen in: Electron Energy-Loss Spectroscopy in the Electron Microscope

Verlag: Springer US

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Abstract

The computer codes discussed in this appendix generate spectra, process spectral data, or calculate scattering cross sections or mean free paths. They are designed as a supplement to Digital Micrograph scripts (Mitchell and Schaffer, 2005) and can be downloaded from http://​tem-eels.​com or from http://​tem-eels.​ca
All are written in MATLAB script. A program to convert DigitalMicrograph data files into MATLAB format is available. As these programs may be updated from time to time, the description that follows in this appendix may not be exact.

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Literatur
Zurück zum Zitat Alexander, D. T. L., Crozier, P. A., and Anderson, J. R. (2008) Brown carbon spheres in east Asian outflow and their optical properties. Science 321, 833–836.CrossRef Alexander, D. T. L., Crozier, P. A., and Anderson, J. R. (2008) Brown carbon spheres in east Asian outflow and their optical properties. Science 321, 833–836.CrossRef
Zurück zum Zitat Choi, B.-H., Merzbacher, E., and Khandelwal, G. S. (1973) Tables for Born approximation calculations of L-subshell ionization by simple heavy charged particles. At. Data 5, 291–304.CrossRef Choi, B.-H., Merzbacher, E., and Khandelwal, G. S. (1973) Tables for Born approximation calculations of L-subshell ionization by simple heavy charged particles. At. Data 5, 291–304.CrossRef
Zurück zum Zitat Egerton, R. F. (1979) K-shell ionization cross-sections for use in microanalysis. Ultramicroscopy 4, 169–179.CrossRef Egerton, R. F. (1979) K-shell ionization cross-sections for use in microanalysis. Ultramicroscopy 4, 169–179.CrossRef
Zurück zum Zitat Egerton, R. F. (1993) Oscillator-strength parameterization of inner-shell cross sections. Ultramicroscopy 50, 13–28.CrossRef Egerton, R. F. (1993) Oscillator-strength parameterization of inner-shell cross sections. Ultramicroscopy 50, 13–28.CrossRef
Zurück zum Zitat Egerton, R. F., and Malac, M. (2002) Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. Ultramicroscopy 92, 47–56.CrossRef Egerton, R. F., and Malac, M. (2002) Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. Ultramicroscopy 92, 47–56.CrossRef
Zurück zum Zitat Egerton, R. F., Wang, F., Malac, M., Moreno, M. S., and Hofer, F. (2008) Fourier-ratio deconvolution and its Bayesian equivalent. Micron 39, 642–647.CrossRef Egerton, R. F., Wang, F., Malac, M., Moreno, M. S., and Hofer, F. (2008) Fourier-ratio deconvolution and its Bayesian equivalent. Micron 39, 642–647.CrossRef
Zurück zum Zitat Egerton, R. F., McLeod, R., Wang, F., and Malac, M. (2010) Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110, 991–997.CrossRef Egerton, R. F., McLeod, R., Wang, F., and Malac, M. (2010) Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110, 991–997.CrossRef
Zurück zum Zitat Erni, R., and Browning, N. D. (2008) The impact of surface and retardation losses on valence electron energy-loss spectroscopy. Ultramicroscopy 108, 84–99.CrossRef Erni, R., and Browning, N. D. (2008) The impact of surface and retardation losses on valence electron energy-loss spectroscopy. Ultramicroscopy 108, 84–99.CrossRef
Zurück zum Zitat Inokuti, M., Dehmer, J. L., Baer, T., and Hanson, D. D. (1981) Oscillator-strength moments, stopping powers, and total inelastic-scattering cross sections of all atoms through strontium. Phys. Rev. A 23, 95–109.CrossRef Inokuti, M., Dehmer, J. L., Baer, T., and Hanson, D. D. (1981) Oscillator-strength moments, stopping powers, and total inelastic-scattering cross sections of all atoms through strontium. Phys. Rev. A 23, 95–109.CrossRef
Zurück zum Zitat Jin, Q., and Li, D. (2006) Determining inelastic mean free path by electron energy loss spectrocopy. Microsc. Microanal. 12 (Suppl. 2), 1186–1187.CrossRef Jin, Q., and Li, D. (2006) Determining inelastic mean free path by electron energy loss spectrocopy. Microsc. Microanal. 12 (Suppl. 2), 1186–1187.CrossRef
Zurück zum Zitat King, W. E., Benedek, R., Merkle, K. L., and Meshii, M. (1987) Damage effects of high energy electrons on metals. Ultramicroscopy 23, 345–354.CrossRef King, W. E., Benedek, R., Merkle, K. L., and Meshii, M. (1987) Damage effects of high energy electrons on metals. Ultramicroscopy 23, 345–354.CrossRef
Zurück zum Zitat Lenz, F. (1954) Zur Streuung mittelschneller Elektronen in kleinste Winkel. Z. Naturforsch. 9A, 185–204. Lenz, F. (1954) Zur Streuung mittelschneller Elektronen in kleinste Winkel. Z. Naturforsch. 9A, 185–204.
Zurück zum Zitat Malis, T., Cheng, S. C., and Egerton, R. F. (1988) EELS log-ratio technique for specimen-thickness measurement in the TEM. J. Electron Microsc. Tech. 8, 193–200.CrossRef Malis, T., Cheng, S. C., and Egerton, R. F. (1988) EELS log-ratio technique for specimen-thickness measurement in the TEM. J. Electron Microsc. Tech. 8, 193–200.CrossRef
Zurück zum Zitat Scofield, J. H. (1978) K- and L-shell ionization of atoms by relativistic electrons. Phys. Rev. A 18, 963–970.CrossRef Scofield, J. H. (1978) K- and L-shell ionization of atoms by relativistic electrons. Phys. Rev. A 18, 963–970.CrossRef
Zurück zum Zitat Slater, J. C. (1930) Atomic shielding constants. Phys. Rev. 36, 57–64.CrossRef Slater, J. C. (1930) Atomic shielding constants. Phys. Rev. 36, 57–64.CrossRef
Zurück zum Zitat Spence, J. C. H. (1979) Uniqueness and the inversion problem of incoherent multiple scattering. Ultramicroscopy 4, 9–12.CrossRef Spence, J. C. H. (1979) Uniqueness and the inversion problem of incoherent multiple scattering. Ultramicroscopy 4, 9–12.CrossRef
Zurück zum Zitat Wong, K., and Egerton, R. F. (1995) Correction for the effects of elastic scattering in core-loss quantification. J. Microsc. 178, 198–207. Wong, K., and Egerton, R. F. (1995) Correction for the effects of elastic scattering in core-loss quantification. J. Microsc. 178, 198–207.
Zurück zum Zitat Zener, C. (1930) Analytic atomic wave functions. Phys. Rev. 36, 51–56.CrossRef Zener, C. (1930) Analytic atomic wave functions. Phys. Rev. 36, 51–56.CrossRef
Zurück zum Zitat Scheinfein, M., and Isaacson, M. (1984) Design and performance of second order aberration corrected spectrometers for use with the scannering transmission electron microscope. In Scanning Electron Microscopy, SEM Inc., A. M. F. O’Hare, IL, Part 4, pp. 1681–1696. Scheinfein, M., and Isaacson, M. (1984) Design and performance of second order aberration corrected spectrometers for use with the scannering transmission electron microscope. In Scanning Electron Microscopy, SEM Inc., A. M. F. O’Hare, IL, Part 4, pp. 1681–1696.
Zurück zum Zitat Wilhelm, P., and Hofer, F. (1992) EELS-microanalysis of the elements Ca to Cu using M23-edges. In Electron Microscopy, Proc. EUREM 92, Granada, Spain, Vol. 1, pp. 281–282. Wilhelm, P., and Hofer, F. (1992) EELS-microanalysis of the elements Ca to Cu using M23-edges. In Electron Microscopy, Proc. EUREM 92, Granada, Spain, Vol. 1, pp. 281–282.
Zurück zum Zitat Mitchell, D. R. G., and Schaffer, B. (2005) Scripting customised microscopy tools for digital micrograph. Ultramicroscopy 103, 319–546.CrossRef Mitchell, D. R. G., and Schaffer, B. (2005) Scripting customised microscopy tools for digital micrograph. Ultramicroscopy 103, 319–546.CrossRef
Zurück zum Zitat Johnson, D. W. (1975) A Fourier method for numerical Kramers-Kronig analysis. J. Phys. A (Math. Gen. Phys.) 8, 490–495.CrossRef Johnson, D. W. (1975) A Fourier method for numerical Kramers-Kronig analysis. J. Phys. A (Math. Gen. Phys.) 8, 490–495.CrossRef
Zurück zum Zitat Iakoubovskii, K., Mitsuishi, K., Nakayama, Y., and Furuya, K. (2008a) Thickness measurements with electron energy loss spectroscopy. Microsc. Res. Tech. 71, 626–631.CrossRef Iakoubovskii, K., Mitsuishi, K., Nakayama, Y., and Furuya, K. (2008a) Thickness measurements with electron energy loss spectroscopy. Microsc. Res. Tech. 71, 626–631.CrossRef
Metadaten
Titel
Computer Programs
verfasst von
R.F. Egerton
Copyright-Jahr
2011
Verlag
Springer US
DOI
https://doi.org/10.1007/978-1-4419-9583-4_7

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