2006 | OriginalPaper | Buchkapitel
Computer Simulation of Diffraction Technique Applied for Measurements of Surface Stress Gradients
verfasst von : J. T. Assis, V. I. Monine, S. A. Philippov, S. M. Iglesias
Erschienen in: III European Conference on Computational Mechanics
Verlag: Springer Netherlands
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
Modern surface treatment technologies, like laser treatment or surface modifications by ion beams, introduce high residual stresses characterized by strong gradients of stress distribution in the depth of treated surface. The diffraction methods of stress gradient determination based on analysis of nonlinearity of d, - sin2 dependency is not sufficient to practical using because experimental criterions predicting the existence and level of stress gradient are absent. Experimental attempts to develop the methodology of stress gradient determination are not successful because of the difficulty to prepare the samples with known parameters of stress gradient. Computer simulation of diffraction profile formed by reflection from surface layers with stress gradient allows to simulate experimental dependency d, = f(sin2) permitting to obtain the relationships between the stress gradient parameters, non-linearity of d, = f(sin2) and broadening of diffraction line caused by stress.