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Journal of Computational Electronics
Erschienen in: Journal of Computational Electronics 4/2016

03.09.2016

Design guidelines for a metallization scheme with multiple-emitter contact lines in BC-BJ solar cells

verfasst von: Marco Guevara, Paul Procel, Raffaele De Rose, Noemi Guerra, Felice Crupi, Marco Lanuzza

Erschienen in: Journal of Computational Electronics | Ausgabe 4/2016

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Abstract

This work presents a study on back contact-back junction solar cells when using a metallization scheme with multiple-emitter contact lines. For this purpose, TCAD-based simulations have been carried out by taking into account realistic parameters and state-of-the-art physical models for silicon solar cells. The analysis has been performed by varying different geometrical parameters related to rear metallization, such as the number of the emitter contacts and the emitter metal coverage. In general, an efficiency improvement has been observed by uniformly placing the multiple contacts along the emitter region and by increasing the number of the emitter metal lines. An optimal emitter metallization fraction has been found for different numbers of contacts as a result of the tradeoff between recombination losses at metal/silicon interfaces and series resistance losses. Moreover, the effect of the multiple-emitter contacts has been evaluated as a function of the finger length, the emitter width, and the rear pitch.
Vorheriger Artikel Design and analysis of new fault-tolerant majority gate for quantum-dot cellular automata
Nächster Artikel Efficient numerical procedure for the determination of the wave function-independent terms in longitudinal optical phonon scattering rates formulated in the Fourier domain

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Metadaten
Titel
Design guidelines for a metallization scheme with multiple-emitter contact lines in BC-BJ solar cells
verfasst von
Marco Guevara
Paul Procel
Raffaele De Rose
Noemi Guerra
Felice Crupi
Marco Lanuzza
Publikationsdatum
03.09.2016
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 4/2016
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-016-0898-y

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