Skip to main content

2020 | OriginalPaper | Buchkapitel

Detection of Hazardous Analyte Using Transparent Gate Thin-Film Transistor

verfasst von : Ajay Kumar, Amit Kumar Goyal, Manan Roy, Neha Gupta, MM Tripathi, Rishu Chaujar

Erschienen in: Micro-Electronics and Telecommunication Engineering

Verlag: Springer Singapore

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

The work mainly focuses on the detection of a hazardous analyte like silicon carbide using TGTFT which has an ITO gate, a bio-receptor of silicon nitride and further compared with the same device with an additional analyte, i.e., silicon carbide added into it. Transfer characteristics and some more electrical properties have been simulated and compared. The drain current (Id) of the analyte TFT increased by 21.59% in contrast to the device which has air. A substantial increment of 17.34% in the electric field of the analyte-added TFT was observed in contrast to the air-filled TGTFT. Some changes were observed in valence band energy (VBE) and conduction band energy (CBE) of analyte device and without analyte device. The addition of analyte changes chemical composition of interface, i.e., changes the electron concentration at interface and therefore altering the effect of specific gate voltage as potential of the interface changes resulting in different results from the one with no analyte. Therefore, changes in the electrical properties of the device pave the way of hazardous analyte detection.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat Karube I, Muramatsu H (1988) Analytical device and method utilizing a piezoelectric crystal biosensor. Google Patents Karube I, Muramatsu H (1988) Analytical device and method utilizing a piezoelectric crystal biosensor. Google Patents
2.
Zurück zum Zitat Oshiman E, Shiraki Y (2010) Analytical device having temperature detection unit. Google Patents Oshiman E, Shiraki Y (2010) Analytical device having temperature detection unit. Google Patents
3.
Zurück zum Zitat Lazcka O, Del Campo FJ, Munoz FX (2007) Pathogen detection: a perspective of traditional methods and biosensors. Biosens Bioelectron 22(7):1205–1217CrossRef Lazcka O, Del Campo FJ, Munoz FX (2007) Pathogen detection: a perspective of traditional methods and biosensors. Biosens Bioelectron 22(7):1205–1217CrossRef
4.
Zurück zum Zitat Stewart KA, Gouliouk V, Keszler DA, Wager JF (2017) Sputtered boron indium oxide thin-film transistors. Solid-State Electron 137:80–84CrossRef Stewart KA, Gouliouk V, Keszler DA, Wager JF (2017) Sputtered boron indium oxide thin-film transistors. Solid-State Electron 137:80–84CrossRef
5.
Zurück zum Zitat Shen Y-C, Yang C-H, Chen S-W, Wu S-H, Yang T-L, Huang J-J (2014) IGZO thin film transistor biosensors functionalized with ZnO nanorods and antibodies. Biosens Bioelectron 54:306–310CrossRef Shen Y-C, Yang C-H, Chen S-W, Wu S-H, Yang T-L, Huang J-J (2014) IGZO thin film transistor biosensors functionalized with ZnO nanorods and antibodies. Biosens Bioelectron 54:306–310CrossRef
6.
Zurück zum Zitat Kim SM, Park S, Lee WJ, Yoon MH (2017) Electronics and bioelectronic interfaces. Handbook of Solid State Chemistry, pp 75–92 Kim SM, Park S, Lee WJ, Yoon MH (2017) Electronics and bioelectronic interfaces. Handbook of Solid State Chemistry, pp 75–92
7.
Zurück zum Zitat Sibley DR, Monsma FJ Jr (1992) Molecular biology of dopamine receptors. Trends Pharmacol Sci 13:61–69CrossRef Sibley DR, Monsma FJ Jr (1992) Molecular biology of dopamine receptors. Trends Pharmacol Sci 13:61–69CrossRef
8.
Zurück zum Zitat Gong Y, Jackson TN (2017) Offset drain ZnO thin-film transistors for high-voltage operation. IEEE Electron Device Lett 38(8):1047–1050CrossRef Gong Y, Jackson TN (2017) Offset drain ZnO thin-film transistors for high-voltage operation. IEEE Electron Device Lett 38(8):1047–1050CrossRef
9.
Zurück zum Zitat Zhao J, Tang W, Yu P, Guo X (2016) Low voltage organic thin-film transistor with reduced sub-gap DOS for power efficient logic circuits. In: 2016 7th international conference on computer aided design for thin-film transistor technologies (CAD-TFT), IEEE, pp 1–1 Zhao J, Tang W, Yu P, Guo X (2016) Low voltage organic thin-film transistor with reduced sub-gap DOS for power efficient logic circuits. In: 2016 7th international conference on computer aided design for thin-film transistor technologies (CAD-TFT), IEEE, pp 1–1
10.
Zurück zum Zitat Kumar A (2017) Effect of trench depth and gate length shrinking assessment on the analog and linearity performance of TGRC-MOSFET. Superlattices Microstruct 109:626–640CrossRef Kumar A (2017) Effect of trench depth and gate length shrinking assessment on the analog and linearity performance of TGRC-MOSFET. Superlattices Microstruct 109:626–640CrossRef
11.
Zurück zum Zitat Kumar A, Gupta N, Chaujar R (2016) Power gain assessment of ITO based transparent gate recessed channel (TGRC) MOSFET for RF/wireless applications. Superlattices Microstruct 91:290–301CrossRef Kumar A, Gupta N, Chaujar R (2016) Power gain assessment of ITO based transparent gate recessed channel (TGRC) MOSFET for RF/wireless applications. Superlattices Microstruct 91:290–301CrossRef
12.
Zurück zum Zitat Kumar A, Gupta N, Chaujar R (2016) TCAD RF performance investigation of transparent gate recessed channel MOSFET. Microelectron J 49:36–42CrossRef Kumar A, Gupta N, Chaujar R (2016) TCAD RF performance investigation of transparent gate recessed channel MOSFET. Microelectron J 49:36–42CrossRef
13.
Zurück zum Zitat Kumar A, Gupta N, Chaujar R (2016) Analysis of novel transparent gate recessed channel (TGRC) MOSFET for improved analog behaviour. Microsyst Technol 22(11):2665–2671CrossRef Kumar A, Gupta N, Chaujar R (2016) Analysis of novel transparent gate recessed channel (TGRC) MOSFET for improved analog behaviour. Microsyst Technol 22(11):2665–2671CrossRef
14.
Zurück zum Zitat Kumar A, Gupta N, Chaujar R (2017) Effect of structured parameters on the hot-carrier immunity of transparent gate recessed channel (TGRC) MOSFET. Microsyst Technol 23(9):4057–4064CrossRef Kumar A, Gupta N, Chaujar R (2017) Effect of structured parameters on the hot-carrier immunity of transparent gate recessed channel (TGRC) MOSFET. Microsyst Technol 23(9):4057–4064CrossRef
15.
Zurück zum Zitat Kumar A, Tiwari B, Singh S, Tripathi MM, Chaujar R (2018) Radiation analysis of N-channel TGRC-MOSFET: an X-Ray dosimeter. IEEE Trans Electron Devices 65(11):5014–5020CrossRef Kumar A, Tiwari B, Singh S, Tripathi MM, Chaujar R (2018) Radiation analysis of N-channel TGRC-MOSFET: an X-Ray dosimeter. IEEE Trans Electron Devices 65(11):5014–5020CrossRef
16.
Zurück zum Zitat Kumar A, Tripathi M, Chaujar R (2017) Investigation of parasitic capacitances of In2O5Sn gate electrode recessed channel MOSFET for ULSI switching applications. Microsyst Technol 23(12):5867–5874CrossRef Kumar A, Tripathi M, Chaujar R (2017) Investigation of parasitic capacitances of In2O5Sn gate electrode recessed channel MOSFET for ULSI switching applications. Microsyst Technol 23(12):5867–5874CrossRef
17.
Zurück zum Zitat Kumar A, Tripathi M, Chaujar R (2018) Reliability issues of In2O5Sn gate electrode recessed channel MOSFET: impact of interface trap charges and temperature. IEEE Trans Electron Devices 65:860–866CrossRef Kumar A, Tripathi M, Chaujar R (2018) Reliability issues of In2O5Sn gate electrode recessed channel MOSFET: impact of interface trap charges and temperature. IEEE Trans Electron Devices 65:860–866CrossRef
18.
Zurück zum Zitat Kumar A, Tripathi MM, Chaujar R (2018) In2O5Sn based transparent gate recessed channel MOSFET: RF small-signal model for microwave applications. AEU—Int J Electron Commun 93:233–241CrossRef Kumar A, Tripathi MM, Chaujar R (2018) In2O5Sn based transparent gate recessed channel MOSFET: RF small-signal model for microwave applications. AEU—Int J Electron Commun 93:233–241CrossRef
19.
Zurück zum Zitat Xu J, Xie H, Liu G, Zhang L, Tong X, Dong C (2016) Ambient effects on the light illumination stability of amorphous InGaZnO thin film transistors. In: 2016 7th international conference on computer aided design for thin-film transistor technologies (CAD-TFT), IEEE, pp 1–1 Xu J, Xie H, Liu G, Zhang L, Tong X, Dong C (2016) Ambient effects on the light illumination stability of amorphous InGaZnO thin film transistors. In: 2016 7th international conference on computer aided design for thin-film transistor technologies (CAD-TFT), IEEE, pp 1–1
20.
Zurück zum Zitat Singh V, Suman C, Kumar S (2006) Indium tin oxide (ITO) films on flexible substrates for organic light emitting diodes. In: Proceedings of ASID p 388 Singh V, Suman C, Kumar S (2006) Indium tin oxide (ITO) films on flexible substrates for organic light emitting diodes. In: Proceedings of ASID p 388
21.
Zurück zum Zitat Murali R, Meindl JD (2007) Modeling the effect of source/drain junction depth on bulk-MOSFET scaling. Solid-state electronics 51(6):823–827CrossRef Murali R, Meindl JD (2007) Modeling the effect of source/drain junction depth on bulk-MOSFET scaling. Solid-state electronics 51(6):823–827CrossRef
22.
Zurück zum Zitat Minami T (2005) Transparent conducting oxide semiconductors for transparent electrodes. Semicond Sci Technol 20(4):S35–S44CrossRef Minami T (2005) Transparent conducting oxide semiconductors for transparent electrodes. Semicond Sci Technol 20(4):S35–S44CrossRef
23.
Zurück zum Zitat Silvaco I (2011) ATLAS user’s manual. Santa Clara, CA, Version 5 Silvaco I (2011) ATLAS user’s manual. Santa Clara, CA, Version 5
Metadaten
Titel
Detection of Hazardous Analyte Using Transparent Gate Thin-Film Transistor
verfasst von
Ajay Kumar
Amit Kumar Goyal
Manan Roy
Neha Gupta
MM Tripathi
Rishu Chaujar
Copyright-Jahr
2020
Verlag
Springer Singapore
DOI
https://doi.org/10.1007/978-981-15-2329-8_20

Neuer Inhalt