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Erschienen in:
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2014 | OriginalPaper | Buchkapitel

3. DfM at 28 nm and Beyond

verfasst von : Artur Balasinski

Erschienen in: Design for Manufacturability

Verlag: Springer New York

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Abstract

Introduction of more advanced technology nodes carries two key risks:

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Vorheriges Kapitel Classic DfM: From 2D to 3D
Nächstes Kapitel New DfM Domain: Stress Effects
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Metadaten
Titel
DfM at 28 nm and Beyond
verfasst von
Artur Balasinski
Copyright-Jahr
2014
Verlag
Springer New York
Buch
Design for Manufacturability

Print ISBN: 978-1-4614-1760-6

Electronic ISBN: 978-1-4614-1761-3

Copyright-Jahr: 2014

DOI
https://doi.org/10.1007/978-1-4614-1761-3_3

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