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Erschienen in:
28.07.2016
Effect of copper inclusion on structural, optical and electrical properties of ZnO thin films
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 12/2016
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Abstract
In the present investigation, the effect of copper inclusion on structural, optical and electrical properties of spray deposited ZnO thin films is studied. The X-ray diffraction studies showed that the films are polycrystalline in nature with hexagonal structure. The optical studies revealed that the band gap energy of ZnO increases from 3.23 to 3.31 eV as Cu inclusion varies from 0 to 6 at. %. The dark electrical resistivity measurement was done by two probe method. The room temperature resistivity of ZnO increases from 10−2 to 102 O-cm depending on Cu inclusion. The thermoelectric power (TEP) measurements confirmed that the spray deposited ZnO films exhibits n-type conductivity. The Seebeck’s coefficient calculated from TEP was found in the range 30–11 µVK−1 depending on Cu inclusion.