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2020 | OriginalPaper | Buchkapitel

1. Effects of Transient Faults in Integrated Circuits

verfasst von : Rodrigo Possamai Bastos, Frank Sill Torres

Erschienen in: On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

Verlag: Springer International Publishing

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Abstract

In the context of reliable and secure integrated circuit (IC) system applications, this chapter generally discusses the effects of transient faults induced by environmental and intentional perturbation sources. The first section briefly analyzes the transient faults induced by environmental perturbation events during the IC lifetime, and the next section synthesizes the consequences of transient faults due to intentional perturbation events, which indeed create very similar transient voltage modifications in IC systems. Furthermore, the electrical-level effects of transient faults in ICs and the consequent failures arisen from the different types of transient-fault effects on synchronous circuits (clocked systems) and asynchronous circuits (clockless systems) are also detailed in the following sections.

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Nächstes Kapitel Effectiveness of Hardware-Level Techniques in Detecting Transient Faults
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Metadaten
Titel
Effects of Transient Faults in Integrated Circuits
verfasst von
Rodrigo Possamai Bastos
Frank Sill Torres
Copyright-Jahr
2020
Buch
On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

Print ISBN: 978-3-030-29352-9

Electronic ISBN: 978-3-030-29353-6

Copyright-Jahr: 2020

DOI
https://doi.org/10.1007/978-3-030-29353-6_1

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