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Erschienen in:
1990 | OriginalPaper | Buchkapitel
Electron and Ion Point Sources, Properties and Applications
verfasst von : Hans-Werner Fink
Erschienen in: Scanning Tunneling Microscopy and Related Methods
Verlag: Springer Netherlands
Enthalten in: Professional Book Archive
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This paper deals with point sources for charged particles. The importance of a well-characterized ensemble of particles in the framework of the quantum mechanical measuring process is illustrated. The engineering of these sources for electrons and noble gas ions and their emission properties are reviewed. Two practical microscopy applications, the resolution of which depends on the “quality” of the particle beam, are presented.