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Electron Nano-Imaging

Basics of Imaging and Diffraction for TEM and STEM

  • 2017
  • Buch
Verfasst von
Nobuo Tanaka
Verlag
Springer Japan
Enthalten in
Springer Professional "Wirtschaft+Technik"
Springer Professional "Technik"

Über dieses Buch

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Inhaltsverzeichnis

Nächste
  • current Page 1
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  1. Frontmatter

  2. Nano-imaging by Transmission Electron Microscopy

    1. Frontmatter

    2. Chapter 1. Seeing Nanometer-Sized World

      Nobuo Tanaka
      Abstract
      The word “Nano” in a part of the title of the present book is an abbreviation of nanometer (nm), which is the unit of length with a prefix in the International Standard of Unit (SI).

    3. Chapter 2. Structure and Imaging of a Transmission Electron Microscope (TEM)

      Nobuo Tanaka
      Abstract
      In this chapter, we overview the structure of a transmission electron microscope (TEM) for nanoimaging, and mathematical descriptions of basic actions of a magnetic round lens are explained.

    4. Chapter 3. Basic Theories of TEM Imaging

      Nobuo Tanaka
      Abstract
      In this chapter, we study the descriptions of waves and their extension to electron waves in TEM.

    5. Chapter 4. Resolution and Image Contrast of a Transmission Electron Microscope (TEM)

      Nobuo Tanaka
      Abstract
      In this chapter, we study the resolution of a TEM and its image contrast by a simple optical theory. The introductory explanations of bright-field and dark-field images are also given for beginners.

    6. Chapter 5. What is High-Resolution Transmission Electron Microscopy?

      Nobuo Tanaka
      Abstract
      From this chapter, we start to study high-resolution transmission electron microscopy (HRTEM), particularly on phase contrast of single atoms and atomic clusters. These are essential points of the famous Scherzer theory for HRTEM.

    7. Chapter 6. Lattice Images and Structure Images

      Nobuo Tanaka
      Abstract
      In the Chap. 5, we studied the phase contrast of single atoms and atomic clusters. In this chapter, another phase contrast images such as lattice fringe images formed by interference of electron waves are explained, and structure images as optimized multiwave lattice images are also described.

    8. Chapter 7. Imaging Theory of High-Resolution TEM and Image Simulation

      Nobuo Tanaka
      Abstract
      In this chapter, based on the knowledge of phase contrast previously studied, we study the linear imaging theory.

    9. Chapter 8. Advanced Transmission Electron Microscopy

      Nobuo Tanaka
      Abstract
      In this chapter, starting with the basic theory of electron energy loss spectroscopy (EELS), we study the advanced topics in TEM such as energy-filtered TEM, electron holography, electron tomography, and aberration-corrected TEM.

  3. Nano-imaging by Scanning Transmission Electron Microscopy

    1. Frontmatter

    2. Chapter 9. What is Scanning Transmission Electron Microscopy (STEM)?

      Nobuo Tanaka
      Abstract
      From this chapter, we start with studying scanning transmission electron microscopy (STEM) and its imaging theory. The STEM which uses a fine electron probe and a scanning system seems different from TEM explained in previous chapters. The image intensity is equivalent to that by TEM due to the reciprocal theorem in optics. The STEM is nowadays recognized as a very effective tool for structural and chemical analyses of nanomaterials.

    3. Chapter 10. Imaging of Scanning Transmission Electron Microscopy (STEM)

      Nobuo Tanaka
      Abstract
      In this chapter, we deepen our knowledge on STEM by studying the reciprocal theorem. Various kinds of imaging modes in STEM are also explained.

    4. Chapter 11. Image Contrast and Its Formation Mechanism in STEM

      Nobuo Tanaka
      Abstract
      In this chapter, various kinds of image contrast and related theories for STEM are explained in detail and their actual STEM images are shown. The introductory knowledge for energy-dispersive X-ray spectroscopy (EDX) and scanning confocal electron microscope (SCEM) is also described.

    5. Chapter 12. Imaging Theory for STEM

      Nobuo Tanaka
      Abstract
      In this chapter, we study the calculation methods of image intensity of STEM, based on the multislice theory.

    6. Chapter 13. Future Prospects and Possibility of TEM and STEM

      Nobuo Tanaka
      Abstract
      This final chapter reviews the recent status of advanced TEM and STEM, and we consider the future prospects for electron microscopy.

    7. Chapter 14. Concluding Remarks

      Nobuo Tanaka
      Abstract
      In this textbook, the imaging of TEM and STEM is explained in detail by focusing on visualization of nanostructures.
Nächste
  • current Page 1
  • 2
Titel
Electron Nano-Imaging
Verfasst von
Nobuo Tanaka
Copyright-Jahr
2017
Verlag
Springer Japan
Electronic ISBN
978-4-431-56502-4
Print ISBN
978-4-431-56500-0
DOI
https://doi.org/10.1007/978-4-431-56502-4

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