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Measurement Techniques
Published in: Measurement Techniques 1/2013

01-04-2013

A Method of Measuring the Temperature Dependence of the Resistance of Vanadium Oxide Nanofilms

Authors: A. S. Oleinik, D. M. Maslov

Published in: Measurement Techniques | Issue 1/2013

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Abstract

A method of measuring the hysteresis dependence of the resistance of the thermosensitive element of a bolometer in real time and under practical operating conditions is investigated. The method provides objective monitoring of the change in the resistance of the thermosensitive layer acted upon by the recorded radiation and external factors.
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Literature
1.
A. S. Oleinik, Representation and Storage of Optical Data on Vanadium Dioxide Films: A Monograph [in Russian], Izd. Saratov. Gos. Tekh. Univ., Saratov, (2006).
2.
M. N. Markov, Infra-Red Radiation Receivers [in Russian], Nauka, Moscow (1968).
3.
K. Brindley, Measurement Transducers [Russian translation], Energoatomizdat, Moscow (1991).
4.
The Mastech MS8221 Digital Multimeter, www.mastech.ru/catalog/mult/ms8221c.html, accessed June 20, 2012.
Metadata
Title
A Method of Measuring the Temperature Dependence of the Resistance of Vanadium Oxide Nanofilms
Authors
A. S. Oleinik
D. M. Maslov
Publication date
01-04-2013
Publisher
Springer US
Published in
Measurement Techniques / Issue 1/2013
Print ISSN: 0543-1972
Electronic ISSN: 1573-8906
DOI
https://doi.org/10.1007/s11018-013-0163-8

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