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2020 | OriginalPaper | Chapter

A New Ageing-Aware Approach via Path Isolation

Authors : Yue Lu, Shengyu Duan, Tom J. Kazmierski

Published in: Languages, Design Methods, and Tools for Electronic System Design

Publisher: Springer International Publishing

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Abstract

NBTI is becoming one of the major circuit reliability issues in nano-scale technologies. BTI can cause a threshold voltage shift in CMOS devices and consequently increase circuit delay. This paper proposed a novel ageing aware approach to improve circuit’s lifetime. The vulnerable circuit paths against ageing effects are isolated. In addition, minimum area overhead is consumed by adopting proposed synthesis algorithm. The simulation results show that the proposed approach can save up to 67.7% area compared with the conventional over-design technique.
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Metadata
Title
A New Ageing-Aware Approach via Path Isolation
Authors
Yue Lu
Shengyu Duan
Tom J. Kazmierski
Copyright Year
2020
DOI
https://doi.org/10.1007/978-3-030-31585-6_5