Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Published in:
Single/Double Precision Floating-Point Division and Square Root Unit Based on SRT-8 Algorithm Read chapter Read first chapter

2016 | OriginalPaper | Chapter

A Radiation Hardening Algorithm on 2nd Order CDR

Authors : Hu Chunmei, Chen Shuming, Liu Yao, Chen Jianjun, Xu Jingyan

Published in: Computer Engineering and Technology

Publisher: Springer Singapore

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

A radiation hardening algorithm named as state-conservation on 2nd order clock and data recovery (CDR) system is presented in this paper. This proposed algorithm is used to resist the single event transient (SET) of CDR tracking loop. A MATLAB model is established to fast evaluate the sensitive position of the system. A circuit model of 5 Gbps half rate CDR together with the hardening algorithm is set up to verify the effect of the proposed algorithm in Cadence design environment. The simulation result shows that SET does not lead to any error data and no loop delay is added. Compared to the RHBD standard-cell technique, the hardening algorithm saves area about 15.3% and reduces power consumption about 47.8%.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

inform now
previous chapter A High-Radix Switch Architecture Based on Silicon Photonic and 3D Integration
next chapter Sub-threshold Performance Driven Choice in Tunneling CNFETs
Literature
1.
He, M.Y., Poulton, J.: A CMOS mixed-signal clock and data recovery circuit for OIF CEI-6G+ backplane transceiver. IEEE J. Solid-State Circ. 41(3), 597–606 (2006)CrossRef
2.
Kromer, C., Sialm, G., Menolfi, C., Schmatz, M.: A 25-Gb/s CDR in 90-nm CMOS for high-density interconnects. In: IEEE International Solid-state Circuits Conference, vol. 41, pp. 1266–1275 (2006)
3.
Savoj, J., Hsieh, K., Upadhyaya, P., An, F.T., Im, J., Jiang, X., et al.: Design of high-speed wireline transceivers for backplane communications in 28 nm CMOS. In: Proceedings of the Custom Integrated Circuits Conference, pp. 1–4 (2012)
4.
Zhang, Y., Gai, W.: SSC tracking analysis and a deeper-SSC estimator. In: IEEE International Symposium on Circuits & Systems, pp. 1408–1411 (2013)
5.
Chang, H.H., Yang, R.J., Liu, S.I.: Low jitter and multirate clock and data recovery circuit using a MSADLL for chip-to-chip interconnection. IEEE Trans. Circ. Syst. I 51(12), 2356–2364 (2004)CrossRef
6.
Premkishore, S., Michael, K., Stephen, W.K., Burger, D., Lorenzo, A.: Modeling the effect of technology trends on the soft error rate of combinational logic. In: Proceedings International Conference on Dependable Systems and Networks, DSN 2002, pp. 389–398 (2010)
7.
Mahatme, N.N., Jagannathan, S., Loveless, T.D., Massengill, L.W., Bhuva, B.L., Wen, S.J., et al.: Comparison of combinational and sequential error rates for a deep submicron process. IEEE Trans. Nucl. Sci. 58(6), 2719–2725 (2011)CrossRef
8.
9.
Armstrong, S.E., Olson, B.D., Holman, W.T., Warner, J., Mcmorrow, D., Massengill, L.W.: Demonstration of a differential layout solution for improved ASET tolerance in CMOS A/MS circuits. IEEE Trans. Nucl. Sci. 57, 3615–3619 (2010)
10.
Hu, C., Chen, S., Huang, P., Liu, Y., Chen, J.: Evaluating the single event sensitivity of dynamic comparator in 5Gbps SerDes. IEICE Electron. Express 12(23), 1–6 (2015)
11.
Liu, Y., Yum, T.Y., Xue, Q., Chan, C.H.: A 50-mW/ch 2.5-Gb/s/ch data recovery circuit for the SFI-5 interface with digital eye-tracking. IEEE J. Solid-State Circ. 39(4), 613–621 (2004)CrossRef
12.
Chen, W.C., Tsai, C.C., Chang, C.H., Peng, Y.C.: A 2.5-8 Gb/s transceiver with 5-tap DFE and second order CDR against 28-inch channel and 5000 ppm SSC in 40 nm CMOS technology. In: IEEE Custom Integrated Circuits Conference, pp. 1–4 (2010)
13.
Wang, S., Mei, H., Baig, M., Bereza, W.: Design considerations for 2nd-order and 3rd-order bang-bang CDR loops. In: Custom Integrated Circuits Conference, pp. 317–320 (2005)
14.
Du, Y., Chen, S., Liu, B.: Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells. Microelectron. J. 44(2), 65–71 (2013)CrossRef
15.
Bin, L., Yankang, D., Hui, X.: Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology. IEICE Electron. Express 11(19), 1–6 (2014)CrossRef
16.
Bing, L., Ruiqiang, S.: Analyzing and mitigation the internal single-event transient in radiation hardened flip-flop at circuit-level. Sci. China Tech. Sci. 57, 1834–1839 (2014)CrossRef
Metadata
Title
A Radiation Hardening Algorithm on 2nd Order CDR
Authors
Hu Chunmei
Chen Shuming
Liu Yao
Chen Jianjun
Xu Jingyan
Copyright Year
2016
Publisher
Springer Singapore
Book
Computer Engineering and Technology

Print ISBN: 978-981-10-3158-8

Electronic ISBN: 978-981-10-3159-5

Copyright Year: 2016

DOI
https://doi.org/10.1007/978-981-10-3159-5_18