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An improved unified creep‐plasticity constitutive model for viscoplastic solder materials of electronic packaging subjected to high-strain-rate impact loadings

  • 01-01-2026
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Abstract

This article delves into the development of an advanced constitutive model for Pb37Sn63 solder materials, crucial for electronic packaging subjected to high-strain-rate impact loadings. The study highlights the limitations of traditional models like Johnson–Cook and Anand, which fail to accurately capture the dynamic behavior of solders under extreme conditions. Through Split Hopkinson Pressure Bar (SHPB) tests, the researchers gathered stress–strain relationships at varying temperatures and strain rates, forming the basis for their improved unified creep-plasticity model. This model introduces a piecewise hardening approach, effectively addressing the two-stage hardening behavior observed in solders. The article also presents finite element simulations of board-level packaging, demonstrating the model's accuracy in predicting dynamic responses under different drop impact angles. The findings underscore the importance of considering both temperature and strain rate effects in practical simulations, providing a reliable basis for engineering applications in electronic packaging design and reliability analysis. The proposed model not only overcomes the limitations of traditional models but also offers a framework adaptable to other solder systems, aligning with RoHS-compliant practices.

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Title
An improved unified creep‐plasticity constitutive model for viscoplastic solder materials of electronic packaging subjected to high-strain-rate impact loadings
Authors
Ning An
Bofeng Li
Yuexing Wang
Xiangyu Sun
Xu He
Publication date
01-01-2026
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 3/2026
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-026-16591-8
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