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Published in:
2011 | OriginalPaper | Chapter
An Online Metric Learning Approach through Margin Maximization
Authors : Adrian Perez-Suay, Francesc J. Ferri, Jesús V. Albert
Published in: Pattern Recognition and Image Analysis
Publisher: Springer Berlin Heidelberg
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This work introduces a method based on learning similarity measures between pairs of objects in any representation space that allows to develop convenient recognition algorithms. The problem is formulated through margin maximization over distance values so that it can discriminate between similar (intra-class) and dissimilar (inter-class) elements without enforcing positive definiteness of the metric matrix as in most competing approaches. A passive-aggressive approach has been adopted to carry out the corresponding optimization procedure. The proposed approach has been empirically compared to state of the art metric learning on several publicly available databases showing its potential both in terms of performance and computation results.