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Published in: Journal of Electronic Testing 2/2015

01-04-2015

Analog Circuits Soft Fault Diagnosis Using Rényi’s Entropy

Authors: Xuan Xie, Xifeng Li, Dongjie Bi, Qizhong Zhou, Sanshan Xie, Yongle Xie

Published in: Journal of Electronic Testing | Issue 2/2015

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Abstract

An analog circuit soft fault diagnosis method using Rényi’s entropy is proposed. This method focuses on extracting the entropy information contained in the probability density function (PDF) of the output of the circuit under test (CUT), which is sensitive to the parameters of circuits. Firstly, using the Lagrange multiplier method with Rényi’s entropy deduces PDF. Then the parameter α of Rényi’s entropy is estimated adaptively by employing the output of CUT through the maximum likelihood estimation method. Finally, the value of Rényi’s entropy can be calculated using the PDF and α parameter. The divergence between the Rényi’s entropy corresponding to the fault and fault free circuits is adopted to detect the fault. The method can detect soft fautls, including the single fault and multiple faults, without complicated models and mass of data, and also without interrupting the inherent connections. We conduct experiments respectively on two circuits that are implemented on an actual circuit board. The effectiveness of the proposed method is demonstrated by the result of the experiment.

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Metadata
Title
Analog Circuits Soft Fault Diagnosis Using Rényi’s Entropy
Authors
Xuan Xie
Xifeng Li
Dongjie Bi
Qizhong Zhou
Sanshan Xie
Yongle Xie
Publication date
01-04-2015
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 2/2015
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-015-5520-x

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