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Journal of Electronic Testing

Archive

2023 (Volume 39 | 5 Issues)

Dec 23

Issue: 5-6/2023

Aug 23

Issue: 4/2023

Jun 23

Issue: 3/2023

Apr 23

Issue: 2/2023

Feb 23

Issue: 1/2023

2022 (Volume 38 | 6 Issues)

Dec 22

Issue: 6/2022

Oct 22

Issue: 5/2022

Aug 22

Issue: 4/2022

Jun 22

Issue: 3/2022

Apr 22

Issue: 2/2022

Feb 22

Issue: 1/2022

2021 (Volume 37 | 5 Issues)

Dec 21

Issue: 5-6/2021

Aug 21

Issue: 4/2021

Jun 21

Issue: 3/2021

Apr 21

Issue: 2/2021

Feb 21

Issue: 1/2021

2020 (Volume 36 | 6 Issues)

Dec 20

Issue: 6/2020

Oct 20

Issue: 5/2020

Aug 20

Issue: 4/2020

Jun 20

Issue: 3/2020

Apr 20

Issue: 2/2020

Feb 20

Issue: 1/2020

2019 (Volume 35 | 6 Issues)

Dec 19

Issue: 6/2019

Oct 19

Issue: 5/2019

Special Issue on International Conference on VLSI Design and Embedded Systems
Aug 19

Issue: 4/2019

Jun 19

Issue: 3/2019

Apr 19

Issue: 2/2019

Feb 19

Issue: 1/2019

2018 (Volume 34 | 6 Issues)

Dec 18

Issue: 6/2018

Oct 18

Issue: 5/2018

Aug 18

Issue: 4/2018

Jun 18

Issue: 3/2018

Special Issue on Analog, Mixed-Signal and RF Testing
Apr 18

Issue: 2/2018

Feb 18

Issue: 1/2018

2017 (Volume 33 | 6 Issues)

Dec 17

Issue: 6/2017

Oct 17

Issue: 5/2017

Aug 17

Issue: 4/2017

Jun 17

Issue: 3/2017

Special Issue on Analog, Mixed-Signal and RF Testing
Apr 17

Issue: 2/2017

Feb 17

Issue: 1/2017

2016 (Volume 32 | 6 Issues)

Dec 16

Issue: 6/2016

Oct 16

Issue: 5/2016

Aug 16

Issue: 4/2016

Special Issue on Analog, Mixed-Signal and RF Testing
Jun 16

Issue: 3/2016

Apr 16

Issue: 2/2016

Feb 16

Issue: 1/2016

2015 (Volume 31 | 5 Issues)

Dec 15

Issue: 5-6/2015

Aug 15

Issue: 4/2015

Jun 15

Issue: 3/2015

Apr 15

Issue: 2/2015

Feb 15

Issue: 1/2015

2014 (Volume 30 | 6 Issues)

Dec 14

Issue: 6/2014

Oct 14

Issue: 5/2014

Aug 14

Issue: 4/2014

Jun 14

Issue: 3/2014

Apr 14

Issue: 2/2014

Feb 14

Issue: 1/2014

2013 (Volume 29 | 6 Issues)

Dec 13

Issue: 6/2013

Oct 13

Issue: 5/2013

Special Issue on Verification and Testing Challenges in Future Microprocessor and SoC Designs
Aug 13

Issue: 4/2013

Special Issue on Defect and Fault Tolerance
Jun 13

Issue: 3/2013

Special Issue on Defect and Fault Tolerance
Apr 13

Issue: 2/2013

Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)
Feb 13

Issue: 1/2013

2012 (Volume 28 | 6 Issues)

Dec 12

Issue: 6/2012

Oct 12

Issue: 5/2012

Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
Aug 12

Issue: 4/2012

Jun 12

Issue: 3/2012

Apr 12

Issue: 2/2012

Feb 12

Issue: 1/2012

Special Issue on Testing of Three-Dimensional Stacked Integrated Circuits

2011 (Volume 27 | 6 Issues)

Dec 11

Issue: 6/2011

Oct 11

Issue: 5/2011

Aug 11

Issue: 4/2011

Jun 11

Issue: 3/2011

Apr 11

Issue: 2/2011

Feb 11

Issue: 1/2011

2010 (Volume 26 | 6 Issues)

Dec 10

Issue: 6/2010

Oct 10

Issue: 5/2010

Aug 10

Issue: 4/2010

Jun 10

Issue: 3/2010

Apr 10

Issue: 2/2010

Special Issue on High-Level Design Validation and Test; Guest Editor: Prabhat Mishra
Feb 10

Issue: 1/2010

Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi

2009 (Volume 25 | 4 Issues)

Dec 09

Issue: 6/2009

Aug 09

Issue: 4-5/2009

Jun 09

Issue: 2-3/2009

Feb 09

Issue: 1/2009

Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim

2008 (Volume 24 | 4 Issues)

Dec 08

Issue: 6/2008

Oct 08

Issue: 5/2008

Aug 08

Issue: 4/2008

Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
Jun 08

Issue: 1-3/2008

Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi

2007 (Volume 23 | 5 Issues)

Dec 07

Issue: 6/2007

SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING
Oct 07

Issue: 5/2007

Aug 07

Issue: 4/2007

Jun 07

Issue: 2-3/2007

Feb 07

Issue: 1/2007

2006 (Volume 22 | 4 Issues)

Dec 06

Issue: 4-6/2006

Jun 06

Issue: 3/2006

Apr 06

Issue: 2/2006

Feb 06

Issue: 1/2006

2005 (Volume 21 | 6 Issues)

Dec 05

Issue: 6/2005

Oct 05

Issue: 5/2005

Aug 05

Issue: 4/2005

Special Issue on On-Line-Testing and Fault Tolerance
Jun 05

Issue: 3/2005

Apr 05

Issue: 2/2005

Feb 05

Issue: 1/2005

2004 (Volume 20 | 6 Issues)

Dec 04

Issue: 6/2004

Oct 04

Issue: 5/2004

On-line Testing
Aug 04

Issue: 4/2004

Special Issue on the Third IEEE Latin-American Test Workshop
Jun 04

Issue: 3/2004

Apr 04

Issue: 2/2004

Feb 04

Issue: 1/2004