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Journal of Electronic Testing

Archive

2024 (Volume 40 | 3 Issues)

2023 (Volume 39 | 5 Issues)

2022 (Volume 38 | 6 Issues)

2021 (Volume 37 | 5 Issues)

2020 (Volume 36 | 6 Issues)

2019 (Volume 35 | 6 Issues)

Oct 19

Issue: 5/2019

Special Issue on International Conference on VLSI Design and Embedded Systems

2018 (Volume 34 | 6 Issues)

Jun 18

Issue: 3/2018

Special Issue on Analog, Mixed-Signal and RF Testing

2017 (Volume 33 | 6 Issues)

Jun 17

Issue: 3/2017

Special Issue on Analog, Mixed-Signal and RF Testing

2016 (Volume 32 | 6 Issues)

Aug 16

Issue: 4/2016

Special Issue on Analog, Mixed-Signal and RF Testing

2015 (Volume 31 | 5 Issues)

2014 (Volume 30 | 6 Issues)

2013 (Volume 29 | 6 Issues)

Oct 13

Issue: 5/2013

Special Issue on Verification and Testing Challenges in Future Microprocessor and SoC Designs
Aug 13

Issue: 4/2013

Special Issue on Defect and Fault Tolerance
Jun 13

Issue: 3/2013

Special Issue on Defect and Fault Tolerance
Apr 13

Issue: 2/2013

Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)

2012 (Volume 28 | 6 Issues)

Oct 12

Issue: 5/2012

Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
Feb 12

Issue: 1/2012

Special Issue on Testing of Three-Dimensional Stacked Integrated Circuits

2011 (Volume 27 | 6 Issues)

2010 (Volume 26 | 6 Issues)

Apr 10

Issue: 2/2010

Special Issue on High-Level Design Validation and Test; Guest Editor: Prabhat Mishra
Feb 10

Issue: 1/2010

Special Issue on Analog, Mixed-Signal and RF Testing; Guest Editor: Karim Arabi

2009 (Volume 25 | 4 Issues)

Feb 09

Issue: 1/2009

Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim

2008 (Volume 24 | 4 Issues)

Aug 08

Issue: 4/2008

Special Issue on Low Power Test; Guest Editors: Nicola Nicolici and Patrick Girard
Jun 08

Issue: 1-3/2008

Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi

2007 (Volume 23 | 5 Issues)

Dec 07

Issue: 6/2007

SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING

2006 (Volume 22 | 4 Issues)

2005 (Volume 21 | 6 Issues)

Aug 05

Issue: 4/2005

Special Issue on On-Line-Testing and Fault Tolerance