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An Introduction to EELS Read chapter Read first chapter

2011 | OriginalPaper | Chapter

Bethe Theory for High Incident Energies and Anisotropic Materials

Author : R.F. Egerton

Published in: Electron Energy-Loss Spectroscopy in the Electron Microscope

Publisher: Springer US

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Abstract

Even for 100-keV incident electrons, it is necessary to use relativistic kinematics to calculate inelastic cross sections, as in Section 3.6.2. Above 200 keV, however, an additional effect starts to become important, representing the fact that the electrostatic interaction is “retarded” due to the finite speed of light. At high incident energies and for isotropic materials, Eq. (3.26) should be replaced by (Møller, 1932; Perez et al., 1977)

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Literature
Egerton, R. F. (1987) EELS at intermediate voltage. In Intermediate Voltage Microscopy and Its Application to Materials Science, ed. K. Rajan, Philips Electron Optics, Mahwah, NJ, pp. 67–71.
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Schattschneider, P., Hébert, C., Franco, H., and Jouffrey, B. (2005) Anisotropic relativistic cross sections for inelastic electron scattering, and the magic angle. Phys. Rev. B 72, 045142 (8 pages).CrossRef
Souche, C., Jouffrey, B., Hug, G., and Nelhiebel, M. (1998) Orientation sensitive EELS – Analysis of boron nitride nanometric hollow spheres. Micron 29, 419–424.CrossRef
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Zaluzec, N. J. (1984) K- and L-shell cross sections for x-ray microanalysis in an AEM. In Analytical Electron Microscopy – 1984, eds. D. B. Williams and D. C. Joy, San Francisco Press, San Francisco, CA, pp. 279–284.
Metadata
Title
Bethe Theory for High Incident Energies and Anisotropic Materials
Author
R.F. Egerton
Copyright Year
2011
Publisher
Springer US
Book
Electron Energy-Loss Spectroscopy in the Electron Microscope

Print ISBN: 978-1-4419-9582-7

Electronic ISBN: 978-1-4419-9583-4

Copyright Year: 2011

DOI
https://doi.org/10.1007/978-1-4419-9583-4_6

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