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Published in:
2014 | OriginalPaper | Chapter
2. Centralized Diagnosis of Discrete Event Systems
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Abstract
Chapter 2 handles the methods and techniques used to achieve the fault diagnosis using a centralized processing structure. It studies two significant event-based approaches of centralized diagnosis of discrete event systems: diagnoser and supervision pattern approaches. In these approaches, the system is represented (modeled) by an automaton in order to achieve or to solve the problem of diagnosis based on the use of a centralized processing structure.