Skip to main content
Top

Characterization and investigation of performance of Sn–Bi alloy used as a thermal interface material

  • 01-05-2023
Published in:

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

The article delves into the critical role of thermal management in modern electronic devices, focusing on the use of Sn–Bi alloy as a thermal interface material (TIM). It begins by highlighting the challenges posed by miniaturization and high integration in electronic devices, leading to poor heat dissipation. The study then explores the use of TIMs to enhance heat transfer, with a particular emphasis on the Sn–Bi alloy. The authors conduct extensive experiments to characterize the thermal contact resistance (TCR) of the Sn–Bi alloy under different thicknesses and loading conditions. The microstructural analysis of the alloy reveals a eutectic morphology with Bi-rich network structures, which contributes to its excellent thermal conductivity. The experimental results demonstrate that the TCR increases with thickness but improves under loading conditions due to better contact area and reduced air gaps. Notably, the study also investigates the temperature distribution at the interface, showing that lower thickness TIMs have more uniform temperature distribution. The article concludes by highlighting the optimal thickness for the Sn–Bi alloy TIM and the potential for further improvements in thermal performance.

Not a customer yet? Then find out more about our access models now:

Individual Access

Start your personal individual access now. Get instant access to more than 164,000 books and 540 journals – including PDF downloads and new releases.

Starting from 54,00 € per month!    

Get access

Access for Businesses

Utilise Springer Professional in your company and provide your employees with sound specialist knowledge. Request information about corporate access now.

Find out how Springer Professional can uplift your work!

Contact us now
Title
Characterization and investigation of performance of Sn–Bi alloy used as a thermal interface material
Authors
M. C. Kumar Swamy
Satyanarayan
Richard Pinto
Publication date
01-05-2023
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 13/2023
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-023-10480-0
This content is only visible if you are logged in and have the appropriate permissions.