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2020 | OriginalPaper | Chapter

Characterization of Microstructurally Small Fatigue Crack Behavior

Authors : Evgenii Malitckii, Heikki Remes, Pauli Lehto, Sven Bossuyt

Published in: Proceedings of the Third International Conference on Theoretical, Applied and Experimental Mechanics

Publisher: Springer International Publishing

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Abstract

Aiming to understand the fracture mechanism accompanying the small fatigue crack propagation in polycrystalline metallic materials like steels the full-field strain measurement using digital image correlation (DIC) method was performed. The developed experimental approach was applied to study the small fatigue crack behavior in body-centered Fe-Cr ferritic stainless steel with the relatively large grain size of about 350 µm. The high spatial measurement accuracy of the strain field analysis was performed using the unique patterning technique with a characteristic speckle size of approximately 10 µm.

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Literature
1.
go back to reference Malitckii, E., Remes, H., Lehto, P., Bossuyt, S.: Full-field strain measurement for microstructurally small fatigue crack propagation using digital image correlation method. J. Vis. Exp. (143), e59134 (2019) Malitckii, E., Remes, H., Lehto, P., Bossuyt, S.: Full-field strain measurement for microstructurally small fatigue crack propagation using digital image correlation method. J. Vis. Exp. (143), e59134 (2019)
2.
go back to reference Malitckii, E., Remes, H., Lehto, P., Yagodzinskyy, Y., Bossuyt, S., Hänninen, H.: Strain accumulation during microstructurally small fatigue crack propagation in bcc Fe-Cr ferritic stainless steel. Acta Mater. 144, 51–59 (2018)CrossRef Malitckii, E., Remes, H., Lehto, P., Yagodzinskyy, Y., Bossuyt, S., Hänninen, H.: Strain accumulation during microstructurally small fatigue crack propagation in bcc Fe-Cr ferritic stainless steel. Acta Mater. 144, 51–59 (2018)CrossRef
Metadata
Title
Characterization of Microstructurally Small Fatigue Crack Behavior
Authors
Evgenii Malitckii
Heikki Remes
Pauli Lehto
Sven Bossuyt
Copyright Year
2020
DOI
https://doi.org/10.1007/978-3-030-47883-4_59

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