Open Access 24-07-2020 | Topical Collection: 18th Conference on Defects (DRIP XVIII)
Characterization of Silicon Crystals Grown from Melt in a Granulate Crucible
Published in: Journal of Electronic Materials | Issue 9/2020
Open Access 24-07-2020 | Topical Collection: 18th Conference on Defects (DRIP XVIII)
Published in: Journal of Electronic Materials | Issue 9/2020