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Published in: Journal of Electronic Materials 9/2020

Open Access 24-07-2020 | Topical Collection: 18th Conference on Defects (DRIP XVIII)

Characterization of Silicon Crystals Grown from Melt in a Granulate Crucible

Authors: K. Dadzis, R. Menzel, U. Juda, K. Irmscher, C. Kranert, M. Müller, M. Ehrl, R. Weingärtner, C. Reimann, N. Abrosimov, H. Riemann

Published in: Journal of Electronic Materials | Issue 9/2020

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Metadata
Title
Characterization of Silicon Crystals Grown from Melt in a Granulate Crucible
Authors
K. Dadzis
R. Menzel
U. Juda
K. Irmscher
C. Kranert
M. Müller
M. Ehrl
R. Weingärtner
C. Reimann
N. Abrosimov
H. Riemann
Publication date
24-07-2020
Publisher
Springer US
Published in
Journal of Electronic Materials / Issue 9/2020
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-020-08309-1

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