Abstract
The detailed structural characterizations are one of the important foundations for the understanding of basic properties of carbon nanotubes (CNTs) and graphene, which plays an important role in the controlled growth, physical property research and applications. In this chapter, we mainly introduce several typical optical and electron microscopy techniques to characterize the structural information of single-walled CNTs (SWCNTs) and graphene. Especailly, we have highlighted commonly-used assignment methods of chiral structures of SWCNTs, including Raman, UV-vis-NIR absorption spectra, photoluminescence, and electron diffraction patterns, etc. For graphene, the determination of layer number and structural defects has been focused on using Raman sepectroscopy and atomic-resolution electron microscopy. With the further development of characterization techniques, the detailed structure and physical properties of SWCNTs and graphene will be ananlyzed more accurately and quantitatively. However, the collaborative utilization of several technologies is still recommended when both the characterization accuracy and efficiency are considered.