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11-09-2017 | Communication | Issue 11/2017

Metallurgical and Materials Transactions A 11/2017

Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction

Journal:
Metallurgical and Materials Transactions A > Issue 11/2017
Authors:
Peter Lynch, Matthew Barnett, Andrew Stevenson, Bevis Hutchinson
Important notes
Manuscript submitted February 22, 2017.

Abstract

Controlling texture in grain-oriented (GO) silicon steel sheet is critical for optimization of its magnetization performance. A new automated laboratory system, based on X-ray Laue diffraction, is introduced as a rapid method for large scale grain orientation mapping and texture measurement in these materials. Wide area grain orientation maps are demonstrated for both macroetched and coated GO steel sheets. The large secondary grains contain uniform lattice rotations, the origins of which are discussed.

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