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Published in:
2015 | OriginalPaper | Chapter
Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly
Authors : Takatoshi Ishii, Maomi Ueno
Published in: Artificial Intelligence in Education
Publisher: Springer International Publishing
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Educational assessments occasionally require “ uniform test forms” (or parallel test forms), in which each test form consists of a different set of items, but the forms are equivalent (i.e., equivalent quality based on test information function of item response theory). However, the construction of uniforms tests often suffers bias of item exposure frequency. Ideally, the item exposure frequency should have a uniform and low distribution. For this purpose, we propose a clique algorithm for uniform test forms assembly with low item exposure. We formalize this test assembly as a searching the clique that has minimum item exposure in the maximum cliques. As the results, the proposed method utilizes the item pool more efficiently than traditional methods do. We demonstrate the effectiveness of the proposed method using simulated and actual data.