2017 | OriginalPaper | Chapter
5. Comparison of Nonlinear System Identification Methods for Free Decay Measurements with Application to MEMS Devices
Authors : Vaclav Ondra, Robin Riethmueller, Matthew R. W. Brake, Christoph W. Schwingshackl, Pavel M. Polunin, Steven W. Shaw
Published in: Sensors and Instrumentation, Volume 5
Publisher: Springer International Publishing
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