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Confidence intervals for high-dimensional accelerated failure time models under measurement errors

  • 01-03-2026
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Abstract

This article delves into the challenges of sparse modeling in high-dimensional survival data, particularly focusing on the accelerated failure time (AFT) model. The study addresses the issues of censoring and measurement errors, which are common in high-throughput technologies like RNA-Seq and whole-genome sequencing. The authors introduce a novel method called the double debiased Lasso (DDL) to handle these challenges effectively. The article provides a comprehensive overview of the model setting, theoretical properties, and the DDL procedure. Simulation studies and real-data analysis are presented to validate the performance of the DDL method, demonstrating its superiority over existing approaches. The findings highlight the importance of accounting for measurement errors and censoring in high-dimensional survival data analysis, offering a robust solution for accurate statistical inference.

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Title
Confidence intervals for high-dimensional accelerated failure time models under measurement errors
Authors
Qin Yu
Xin Zhou
Jia Zhou
Zemin Zheng
Publication date
01-03-2026
Publisher
Springer US
Published in
Lifetime Data Analysis / Issue 1/2026
Print ISSN: 1380-7870
Electronic ISSN: 1572-9249
DOI
https://doi.org/10.1007/s10985-025-09685-8
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