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Published in: Microsystem Technologies 4/2020

07-01-2020 | Correction

Correction to: Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions

Authors: Kurmendra, Rajesh Kumar

Published in: Microsystem Technologies | Issue 4/2020

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Excerpt

The original version of this article unfortunately contains a typing error. Last term of Eq. (5) and brackets were incorrectly placed while article preparation and the correct version of that equation should be
$$ C_{1,u} = \frac{{ \in_{0} A}}{{g_{0} + \frac{{t_{d} }}{{ \in_{r} }}}} + \frac{2 \in . W}{\pi }\left[ {\begin{array}{*{20}c} {{\text{ln}}\left( {\frac{\pi .w}{{g_{0} + \frac{{t_{d} }}{{ \in_{r} }}}}} \right) + \ln \left( {\left( {1 + \frac{{2 t_{b} }}{{g_{0} + \frac{{t_{d} }}{{ \in_{r} }}}}} \right) + 2 \sqrt {\left( {\frac{{t_{b} }}{{g_{0} + \frac{{t_{d} }}{{ \in_{r} }}}} + \frac{{t_{b}^{2} }}{{\left( {g_{0} + \frac{{t_{d} }}{{ \in_{r} }}} \right)^{2} }}} \right)} } \right)} \\ {} \\ \end{array} } \right] $$

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Metadata
Title
Correction to: Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions
Authors
Kurmendra
Rajesh Kumar
Publication date
07-01-2020
Publisher
Springer Berlin Heidelberg
Published in
Microsystem Technologies / Issue 4/2020
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-019-04739-y

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