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Published in: Journal of Materials Science: Materials in Electronics 3/2014

01-03-2014

Corrosion behavior of Sn–3.0Ag–0.5Cu solder under high-temperature and high-humidity condition

Authors: Mingna Wang, Jianqiu Wang, Wei Ke

Published in: Journal of Materials Science: Materials in Electronics | Issue 3/2014

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Abstract

The aim of this study is to evaluate the corrosion behavior of Sn–3.0Ag–0.5Cu (SAC305) solder alloy under high-temperature and high-humidity condition. The corrosion of SAC305 alloy was attributed to the oxidation of Sn, which formed SnO2 and SnO, and SnO2 existed on the outer layer of the oxide film. After a period exposure, a stable and dense protective oxide film formed on the specimen surfaces, and the specimen which exposed at 75 °C had the thickset oxide film.

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Literature
1.
go back to reference C.F. Han, Q. Liu, D.G. Ivey, Electrochemical composite deposition of Sn–Ag–Cu alloys. Mater. Sci. Eng. B 164, 172–179 (2009)CrossRef C.F. Han, Q. Liu, D.G. Ivey, Electrochemical composite deposition of Sn–Ag–Cu alloys. Mater. Sci. Eng. B 164, 172–179 (2009)CrossRef
2.
go back to reference N. Bai, X. Chen, A new unified constitutive model with short- and longrange back stress for lead-free solders of Sn–3Ag–0.5Cu and Sn–0.7Cu. Int. J. Plast 25, 2181–2203 (2009)CrossRef N. Bai, X. Chen, A new unified constitutive model with short- and longrange back stress for lead-free solders of Sn–3Ag–0.5Cu and Sn–0.7Cu. Int. J. Plast 25, 2181–2203 (2009)CrossRef
3.
go back to reference C. Andersson, J. Liu, Effect of corrosion on the low cycle fatigue behavior of Sn–4.0Ag–0.5Cu lead-free solder joints. Int. J. Fatigue 30, 917–930 (2008)CrossRef C. Andersson, J. Liu, Effect of corrosion on the low cycle fatigue behavior of Sn–4.0Ag–0.5Cu lead-free solder joints. Int. J. Fatigue 30, 917–930 (2008)CrossRef
4.
go back to reference C.Y. Lin, J.H. Chou, Y.G. Lee, U.S. Mohanty, Preparation of Sn–3.5Ag nano-solder by supernatant process. J. Alloy. Compd. 470, 328–331 (2009)CrossRef C.Y. Lin, J.H. Chou, Y.G. Lee, U.S. Mohanty, Preparation of Sn–3.5Ag nano-solder by supernatant process. J. Alloy. Compd. 470, 328–331 (2009)CrossRef
5.
go back to reference J.S. Janne, T.N. Sami, K.L. Toivo, O.R. Eero, Mechanical and microstructural properties of SnAgCu solder joints. Mater. Sci. Eng. A 420, 55–62 (2006)CrossRef J.S. Janne, T.N. Sami, K.L. Toivo, O.R. Eero, Mechanical and microstructural properties of SnAgCu solder joints. Mater. Sci. Eng. A 420, 55–62 (2006)CrossRef
6.
go back to reference K. Kanlayasiri, T. Ariga, Influence of thermal aging on microhardness and microstructure of Sn–0.3Ag–0.7Cu–xIn lead-free solders. J. Alloy. Compd. 504, L5–L9 (2010)CrossRef K. Kanlayasiri, T. Ariga, Influence of thermal aging on microhardness and microstructure of Sn–0.3Ag–0.7Cu–xIn lead-free solders. J. Alloy. Compd. 504, L5–L9 (2010)CrossRef
7.
go back to reference S. Nurmi, J. Sundelin, E. Ristolainen, T. Lepisto, The effect of solder paste composition on the reliability of SnAgCu joints. Microelectron. Reliab. 44, 485–494 (2004)CrossRef S. Nurmi, J. Sundelin, E. Ristolainen, T. Lepisto, The effect of solder paste composition on the reliability of SnAgCu joints. Microelectron. Reliab. 44, 485–494 (2004)CrossRef
8.
go back to reference L.L. Gao, S.B. Xue, L. Zhang, Z. Sheng, F. Ji, W. Dai, S.L. Yu, G. Zeng, Effect of alloying elements on properties and microstructures of SnAgCu solders. Microelectron. Eng. 87, 2025–2034 (2010)CrossRef L.L. Gao, S.B. Xue, L. Zhang, Z. Sheng, F. Ji, W. Dai, S.L. Yu, G. Zeng, Effect of alloying elements on properties and microstructures of SnAgCu solders. Microelectron. Eng. 87, 2025–2034 (2010)CrossRef
9.
go back to reference D. Herkommer, J. Punch, M. Reid, A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling conditions. Microelectron. Reliab. 50, 116–126 (2010)CrossRef D. Herkommer, J. Punch, M. Reid, A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling conditions. Microelectron. Reliab. 50, 116–126 (2010)CrossRef
10.
go back to reference F.J. Cheng, F. Gao, H. Nishikawa, T. Takemoto, Interaction behavior between the additives and Sn in Sn–3.0Ag–0.5Cu-based solder alloys and the relevant joint solderability. J. Alloy. Compd. 472, 530–534 (2009)CrossRef F.J. Cheng, F. Gao, H. Nishikawa, T. Takemoto, Interaction behavior between the additives and Sn in Sn–3.0Ag–0.5Cu-based solder alloys and the relevant joint solderability. J. Alloy. Compd. 472, 530–534 (2009)CrossRef
11.
go back to reference Y.L. Gao, E. Zhuravlev, C.D. Zou, B. Yang, Q.J. Zhai, C. Schick, Calorimetric measurements of undercooling in single micron sized SnAgCu particles in a wide range of cooling rates. Thermochim. Acta 482, 1–7 (2009)CrossRef Y.L. Gao, E. Zhuravlev, C.D. Zou, B. Yang, Q.J. Zhai, C. Schick, Calorimetric measurements of undercooling in single micron sized SnAgCu particles in a wide range of cooling rates. Thermochim. Acta 482, 1–7 (2009)CrossRef
12.
go back to reference M. Abtew, G. Selvaduray, Lead-free solders in microelectronics. Mater. Sci. Eng. R 27, 95–141 (2000)CrossRef M. Abtew, G. Selvaduray, Lead-free solders in microelectronics. Mater. Sci. Eng. R 27, 95–141 (2000)CrossRef
13.
go back to reference D. Rocak, S. Macek, J. Sitek, M. Hrovat, K. Bukat, Z. Drozd, A reliability study of the lead-free solder connections of miniature chip components on hybrid circuits. Microelectron. Reliab. 47, 986–995 (2007)CrossRef D. Rocak, S. Macek, J. Sitek, M. Hrovat, K. Bukat, Z. Drozd, A reliability study of the lead-free solder connections of miniature chip components on hybrid circuits. Microelectron. Reliab. 47, 986–995 (2007)CrossRef
14.
go back to reference D.Z. Li, P.P. Conway, C.Q. Liu, Corrosion characterization of tin–lead and lead free solders in 3.5 wt% NaCl solution. Corros. Sci. 50, 995–1004 (2008)CrossRef D.Z. Li, P.P. Conway, C.Q. Liu, Corrosion characterization of tin–lead and lead free solders in 3.5 wt% NaCl solution. Corros. Sci. 50, 995–1004 (2008)CrossRef
15.
go back to reference F. Song, S.W.R. Lee, Corrosion of Sn–Ag–Cu lead-free solders and the corresponding effects on board level solder joint reliability, in Proceedings of the IEEE, Electronic Components and Technology Conference, 2006, pp. 891–897 F. Song, S.W.R. Lee, Corrosion of Sn–Ag–Cu lead-free solders and the corresponding effects on board level solder joint reliability, in Proceedings of the IEEE, Electronic Components and Technology Conference, 2006, pp. 891–897
16.
go back to reference U.S. Mohanty, K.L. Lin, Electrochemical corrosion behaviour of Pb-free Sn-8.5Zn-0.05Al-XGa and Sn-3Ag-0.5Cu alloys in chloride containing aqueous solution. Corros. Sci. 50, 2437–2443 (2008)CrossRef U.S. Mohanty, K.L. Lin, Electrochemical corrosion behaviour of Pb-free Sn-8.5Zn-0.05Al-XGa and Sn-3Ag-0.5Cu alloys in chloride containing aqueous solution. Corros. Sci. 50, 2437–2443 (2008)CrossRef
17.
go back to reference F. Rosalbino, E. Angelini, G. Zanicchi, R. Carlini, R. Marazza, Electrochemical corrosion study of Sn–3Ag–3Cu solder alloy in NaCl solution. Electrochim. Acta 54, 7231–7325 (2009)CrossRef F. Rosalbino, E. Angelini, G. Zanicchi, R. Carlini, R. Marazza, Electrochemical corrosion study of Sn–3Ag–3Cu solder alloy in NaCl solution. Electrochim. Acta 54, 7231–7325 (2009)CrossRef
18.
go back to reference U.S. Mohanty, K.L. Lin, Effect of Al on the electrochemical corrosion behaviour of Pb free Sn-8.5 Zn-0.5 Ag-XAl-0.5 Ga solder in 3.5% NaCl solution. Appl. Surf. Sci. 252, 5907–5916 (2006)CrossRef U.S. Mohanty, K.L. Lin, Effect of Al on the electrochemical corrosion behaviour of Pb free Sn-8.5 Zn-0.5 Ag-XAl-0.5 Ga solder in 3.5% NaCl solution. Appl. Surf. Sci. 252, 5907–5916 (2006)CrossRef
19.
go back to reference U.S. Mohanty, K.L. Lin, Electrochemical corrosion behaviour of lead-free Sn-8.5 Zn-XAg-0.1 Al-0.5 Ga solder in 3.5% NaCl solution. Mater. Sci. Eng. A 406, 34–42 (2005)CrossRef U.S. Mohanty, K.L. Lin, Electrochemical corrosion behaviour of lead-free Sn-8.5 Zn-XAg-0.1 Al-0.5 Ga solder in 3.5% NaCl solution. Mater. Sci. Eng. A 406, 34–42 (2005)CrossRef
20.
go back to reference M.N. Wang, J.Q. Wang, H. Feng, W. Ke, In-situ observation of fracture behavior of Sn–3.0Ag–0.5Cu lead-free solder during three-point bending tests in ESEM. Mater. Sci. Eng. A 558, 649–655 (2012)CrossRef M.N. Wang, J.Q. Wang, H. Feng, W. Ke, In-situ observation of fracture behavior of Sn–3.0Ag–0.5Cu lead-free solder during three-point bending tests in ESEM. Mater. Sci. Eng. A 558, 649–655 (2012)CrossRef
21.
go back to reference M.N. Wang, J.Q. Wang, H. Feng, W. Ke, Effects of microstructure and temperature on corrosion behavior of Sn–3.0Ag–0.5Cu lead-free solder. J Mater. Sci: Mater. Electron. 23, 148–155 (2012) M.N. Wang, J.Q. Wang, H. Feng, W. Ke, Effects of microstructure and temperature on corrosion behavior of Sn–3.0Ag–0.5Cu lead-free solder. J Mater. Sci: Mater. Electron. 23, 148–155 (2012)
22.
go back to reference M.N. Wang, J.Q. Wang, H. Feng, W. Ke, Effect of Ag3Sn intermetallic compounds on corrosion of Sn–3.0Ag–0.5Cu solder under high-temperature and high-humidity condition. Corros. Sci. 63, 20–28 (2012)CrossRef M.N. Wang, J.Q. Wang, H. Feng, W. Ke, Effect of Ag3Sn intermetallic compounds on corrosion of Sn–3.0Ag–0.5Cu solder under high-temperature and high-humidity condition. Corros. Sci. 63, 20–28 (2012)CrossRef
23.
go back to reference F.Y. Hung, H.M. Lin, P.S. Chen, T.S. Lui, L.H. Chen, A study of the thin film on the surface of Sn–3.5Ag/Sn–3.5Ag–2.0Cu lead-free alloy. J. Alloy. Compd. 415, 85–92 (2006)CrossRef F.Y. Hung, H.M. Lin, P.S. Chen, T.S. Lui, L.H. Chen, A study of the thin film on the surface of Sn–3.5Ag/Sn–3.5Ag–2.0Cu lead-free alloy. J. Alloy. Compd. 415, 85–92 (2006)CrossRef
24.
go back to reference S.S. Zhang, Y.J. Zhang, H.W. Wang, Effect of oxide thickness of solder powders on the coalescence of SnAgCu lead-free solder pastes. J. Alloy. Compd. 487, 682–686 (2009)CrossRef S.S. Zhang, Y.J. Zhang, H.W. Wang, Effect of oxide thickness of solder powders on the coalescence of SnAgCu lead-free solder pastes. J. Alloy. Compd. 487, 682–686 (2009)CrossRef
25.
go back to reference T. Sasaki, R. Kanagawa, T. Ohtsuka, K. Miura, Corrosion products of tin in humid air containing sulfur dioxide and nitrogen dioxide at room temperature. Corros. Sci. 45, 847–854 (2003)CrossRef T. Sasaki, R. Kanagawa, T. Ohtsuka, K. Miura, Corrosion products of tin in humid air containing sulfur dioxide and nitrogen dioxide at room temperature. Corros. Sci. 45, 847–854 (2003)CrossRef
26.
go back to reference L. Bian, Y.J. Weng, X.Y. Li, Observation of micro-droplets on metal surface in early atmospheric corrosion. Electrochem. Commun. 7, 1033–1038 (2005)CrossRef L. Bian, Y.J. Weng, X.Y. Li, Observation of micro-droplets on metal surface in early atmospheric corrosion. Electrochem. Commun. 7, 1033–1038 (2005)CrossRef
27.
go back to reference H. Chang, H.T. Chen, M.Y. Li, L. Wang, Y.G. Fu, Generation of Tin(II) oxide crystals on lead-free solder joints in deionized water. J. Electron. Mater. 38, 2712–2717 (2009)CrossRef H. Chang, H.T. Chen, M.Y. Li, L. Wang, Y.G. Fu, Generation of Tin(II) oxide crystals on lead-free solder joints in deionized water. J. Electron. Mater. 38, 2712–2717 (2009)CrossRef
28.
go back to reference Q.V. Bui, N.D. Nam, B.-I. Noh, A. Kar, J.-G. Kim, S.-B. Jung, Effect of Ag addition on the corrosion properties of Sn-based solder alloys. Mater. Corros. 61, 30–33 (2009)CrossRef Q.V. Bui, N.D. Nam, B.-I. Noh, A. Kar, J.-G. Kim, S.-B. Jung, Effect of Ag addition on the corrosion properties of Sn-based solder alloys. Mater. Corros. 61, 30–33 (2009)CrossRef
29.
go back to reference M.A. Dudek, N. Chawla, Oxidation behavior of rare-earth-containing Pb-free solders. J. Electron. Mater. 38, 210–220 (2009)CrossRef M.A. Dudek, N. Chawla, Oxidation behavior of rare-earth-containing Pb-free solders. J. Electron. Mater. 38, 210–220 (2009)CrossRef
30.
go back to reference C.A. Gervasi, P.E. Alvarez, M.V. Fiori Bimbi, M.E. Folquer, Comparative cyclic voltammetry and SEM analysis of tin electrodes in citrate buffer solutions. J. Electroanal. Chem. 601, 194–204 (2007)CrossRef C.A. Gervasi, P.E. Alvarez, M.V. Fiori Bimbi, M.E. Folquer, Comparative cyclic voltammetry and SEM analysis of tin electrodes in citrate buffer solutions. J. Electroanal. Chem. 601, 194–204 (2007)CrossRef
Metadata
Title
Corrosion behavior of Sn–3.0Ag–0.5Cu solder under high-temperature and high-humidity condition
Authors
Mingna Wang
Jianqiu Wang
Wei Ke
Publication date
01-03-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 3/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-1714-8

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