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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 23/2018

08-10-2018

Crystal structure and microwave dielectric properties of low-permittivity Sr2MgSi2O7 ceramic

Authors: Mi Xiao, Yanshuang Wei, Hongrui Sun, Jie Lou, Ping Zhang

Published in: Journal of Materials Science: Materials in Electronics | Issue 23/2018

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Abstract

Low-permittivity Sr2MgSi2O7 ceramics with tetragonal crystal structure were prepared through the conventional solid-state method. X-ray diffraction patterns and scanning electron microscopy were used to analyze the phase and micromorphology of the specimens sintered at temperature from 1260 to 1320 °C. The bond ionicity, lattice energy and bond energy of Sr2MgSi2O7 ceramics were calculated to investigate the relationships between microwave dielectric properties and microstructures. Optimum microwave dielectric properties were obtained when the sample was sintered at 1280 °C for 4h: εr = 6.85, Q × f0 = 22,530 GHz (f = 9.20 GHz), τf = − 32 ppm/°C.
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Metadata
Title
Crystal structure and microwave dielectric properties of low-permittivity Sr2MgSi2O7 ceramic
Authors
Mi Xiao
Yanshuang Wei
Hongrui Sun
Jie Lou
Ping Zhang
Publication date
08-10-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 23/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-0168-9

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