Skip to main content
Top

2013 | OriginalPaper | Chapter

3. Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Author : Josef Humlicek

Published in: Ellipsometry at the Nanoscale

Publisher: Springer Berlin Heidelberg

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

We review here basic theoretical approaches to the optical response of nanostructured materials. We use the well established framework of Effective medium approximation (EMA) and discuss key issues of its use. The treatment of this extensive subject is adapted to the needs of ellipsometric/polarimetric measurements on nanostructured materials. In Sects. 3.1 and 3.2 we formulate the problems and establish notation. Then, we recall and discuss, in Sects. 3.3 and 3.4, several well-known formulae for the effective dielectric function. Sections 3.5 and 3.6 are devoted to a fairly detailed comparison of selected measured data with results of the EMA models. We also assess the uncertainties involved in the EMA approach by visualizing the differences between results of its different versions (Sect. 3.7) and by calculating the differences from exact solutions (Sect. 3.8). Finally, Sect. 3.9 is devoted to the discussion of possible resonant behaviour of EMA mixtures.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference J.C. Maxwell, A Treatise on Electricity and Magnetism, vol. I, 3rd edn. (Clarendon Press, Oxford, 1904), Sect. 314 J.C. Maxwell, A Treatise on Electricity and Magnetism, vol. I, 3rd edn. (Clarendon Press, Oxford, 1904), Sect. 314
2.
go back to reference L.D. Landau, E.M. Lifshitz, Electrodynamics of Continuous Media, 2nd edn. (Pergamon Press, Oxford, 1984), Sect. 9 L.D. Landau, E.M. Lifshitz, Electrodynamics of Continuous Media, 2nd edn. (Pergamon Press, Oxford, 1984), Sect. 9
4.
go back to reference J.D. Jackson, Classical Electrodynamics (Wiley, New York, 1962) J.D. Jackson, Classical Electrodynamics (Wiley, New York, 1962)
5.
go back to reference J.A. Stratton, Electromagnetic Theory (McGraw-Hill, New York, 1941) J.A. Stratton, Electromagnetic Theory (McGraw-Hill, New York, 1941)
8.
go back to reference D.A.G. Bruggeman, Ann. Phys. (Leipzig) 24, 636 (1935) D.A.G. Bruggeman, Ann. Phys. (Leipzig) 24, 636 (1935)
9.
go back to reference A. Sihvola, Electromagnetic Mixing Formulas and Applications (IEE, Stevenage, 1999) A. Sihvola, Electromagnetic Mixing Formulas and Applications (IEE, Stevenage, 1999)
10.
11.
go back to reference R.P. Feynman, R.B. Leighton, M. Sands, The Feynman Lectures on Physics, vol. II (Addison-Wesley, Boston, 1964), Sect. 32–5 R.P. Feynman, R.B. Leighton, M. Sands, The Feynman Lectures on Physics, vol. II (Addison-Wesley, Boston, 1964), Sect. 32–5
12.
go back to reference International Critical Tables of Numerical Data, Physics, Chemistry and Technology, vol. 2, First Electronic Edition (Knovel, Norwich, New York, 2003), pp. 334–355 International Critical Tables of Numerical Data, Physics, Chemistry and Technology, vol. 2, First Electronic Edition (Knovel, Norwich, New York, 2003), pp. 334–355
23.
go back to reference J. Chaloupka, D. Munzar, J. Humlíček, Advanced mueller ellipsometry instrumentation and data analysis, ed. by M. Losurdo, K. Hingerl, Ellipsometry at the nanoscale J. Chaloupka, D. Munzar, J. Humlíček, Advanced mueller ellipsometry instrumentation and data analysis, ed. by M. Losurdo, K. Hingerl, Ellipsometry at the nanoscale
Metadata
Title
Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations
Author
Josef Humlicek
Copyright Year
2013
Publisher
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-33956-1_3